Logic Analysis and Eye Diagram Measurements
up to 1.5 Gbits/second
The 16760A logic analysis module
provides eye diagram measurements
as well as conventional state and
timing measurements on differential
signals up to 1.5 Gbits/second.
Low-capacitance, high-density probes
provide minimum loading of your
high-speed bus.
Signal Integrity Validation
With eye scan, you can make eye
diagram measurements on hundreds
of nodes simultaneously. You can now
bolster your confidence in the signal
integrity of your design without
stretching the schedule.
Differential Signals
Many high-speed designs use differential signaling to minimize simultaneous switching noise and to provide
immunity to crosstalk and noise. The
differential inputs of the Agilent
16760A allow you to acquire differential signals with complete confidence.
Single-ended probes are also available.
Small-Amplitude Signals
Many high-speed designs use small signal amplitudes to limit slew rates and
reduce power. The 16760A can make
reliable measurements on differential
signals as small as 200 mV p-p.
Setup and Hold
As state speeds increase, the data
valid window shrinks. To make
reliable measurements, a logic
analyzer’s combined setup and hold
window must be smaller than the data
valid window of the signals it is
acquiring. The Agilent 16760A has a
combined setup and hold time of
500 ps after running eye finder,
matching the data valid window of
very high-speed buses.
Agilent’s eye finder technology automatically adjusts the setup and hold
on each channel with 10 ps resolution,
eliminating the need for manual
adjustment and ensuring the highest
confidence in accurate state
measurements at speeds up to
1.5 Gbits/second.
Probes to complete the connection to your target must be ordered separately.
Three probes are available for the 16760A. Each of these probes requires a mating
connector on the target system PC board. Refer to “Probing Solutions for Agilent
Technologies Logic Analysis Systems” 5968-4632E, for more details.
Agilent Description Maximum Minimum Capacitance
Model Number State Clock Input Amplitude Including Connector
E5378A 34-channel 1.5 Gbits/s 250 mV p-p 1.5 pF
single-ended
probe
E5379A 17-channel 1.5 Gbits/s 200 mV p-p 1.5 pF
differential probe
E5380A 34-channel 600 Mbits/s 300 mV p-p 3 pF
Mictor-compatible
probe
Probing
The Agilent 16760A uses an innovative
probing system with only 1.5 pF of
probe tip capacitance, including the
connector.
Ground pins located between every
pair of signal pins provide excellent
channel-to-channel isolation at
high speeds.
Applications
• Multi-channel signal integrity
validation
• High-speed bus analysis
• Deep trace capture with timing or
state analysis
• High-speed computer and
communications system debug
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Product specifications and descriptions in this
document subject to change without notice.
© Agilent Technologies, Inc. 2002
Printed in USA August 6, 2002
5988-1665EN
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