Agilent 1670G Technical Data

Agilent Technologies 1670G Series Benchtop Logic Analyzers
Technical Data
Affordable logic analyzers designed for your exact needs
Agilent Technologies 1670G Series benchtop logic analyzers enable design engineers to pur­chase a logic analyzer that meets their exact needs and their budg­et.
The 1670G Series models have the option of a built-in, 500 MHz, 2 GSa/s oscilloscope that can be triggered by the logic analyzer. Some of the toughest hardware debug problems can be found only with the digital triggering capabilities of a logic analyzer and can be solved only with the analog resolution of an oscilloscope.
An optional pattern generator in the 1670G Series allows designers to substitute stimulus for missing subsystems during product development.
The 1670G Series helps simplify the capture and analysis of complex events with optional 256K or 2M deep memory. Deep memory is a valuable logic analyzer feature for debugging embedded microprocessor systems.
The units include a VGA resolu­tion color flat panel display to help you find information quick­ly. The user interface helps to locate the source of design problems in less time. You have
Figure 1. Agilent’s 1670G Series Benchtop Logic Analyzers Offer Deep Memory
and Integrated Oscilloscope or Pattern Generator Options.
Agilent Model Number 1670G 1671G 1672G 1673G 1664A
_______________________________________________________________________________________
Channel count 136 102 68 34 34 Timing analysis speed 250/500 MHz (full/half channels) State analysis speed 150 MHz 50 MHz State clock/qualifiers 4 2 Memory depth/channel
[3]
64/128K (full/half channels) 4/8K
with option 1
[1], [3]
256/512K n/a
with option 2
[3]
2/4M n/a
Option 3
[2]
2-channel, 500 MHz, 2 GSa/s, 32K n/a (oscilloscope) sample oscilloscope Option 4 32-channel, 100/200 MHz, 256K n/a (pattern generator) vector pattern generator Built-in display color monochrome LAN port Thin LAN & Ethertwist
[1]
Choose memory option 1 or 2.
[2]
Choose either the scope or the pattern generator (compatible with option 1 or 2).
[3]
Time or state tags halve the acquisition memory when there are no unassigned pods.
the option of using a mouse or the front panel to easily navigate through the user interface; a PC style keyboard is also supported.
A compact all-in-one design helps save space on a crowded lab bench.
2
.
Features Benefits
State/timing analyzer Select the number of channels to match your application
(34, 68, 102, 136).
Optional deep memory 256K or 2M of memory allows capture and analysis of much
longer periods of execution. Helps solve poorly understood or difficult to reproduce problems.
Optional oscilloscope An integrated oscilloscope can be triggered from the
analyzer (and vice versa) and provides the ability to view
analog and digital signals simultaneously. Optional pattern An integrated pattern generator provides stimulus for generator missing components, so that testing can begin before the
system is complete. Trigger functions Trigger functions are depicted graphically and textually, and
may be combined to create custom trigger sequences for
capturing a complex series of events. Global markers Track a symptom in one domain (e.g. timing) to its cause in
another domain (e.g. analog). Documentation capability Save screen shots in standard TIFF, PCX, and EPS formats on
disk. Print screen shots and trace listings to a local
printer. Save acquired data in ASCII format for post
processing. Processor and bus Quickly and reliably connect to a wide variety of specific support processors and buses. Inverse assemblers allow data to be
viewed at the assembly level. LAN Ethertwist and ThinLAN connectors support FTP, PC/NFS
protocols, and work with X11 windows packages. Users can
program the analyzer, archive data, and setup files via telnet
sockets. Probing A wide variety of IC clips, QFP adapters, QFP probes, and
headers are available to help connect the analyzer to the
system under test.
Figure 2. Logic Analyzer Dimensions and Weight
Figure 3. Diagram of Logic Analyzer’s Front and Rear Panels
pods
external trigger BNCs
RS-232-C connector
GPIB connector
keyboard
parallel printer connector
LAN connectors
line power module
mouse
Weight = 28.6 lbs. (13 kg)
Agilent Technologies 1670G Series Specifications
13.0 in. (330 mm)
8.1 in. (205 mm)
17.3 inches (440 mm)
14.5 in. (367 mm)
quick menu keys
H
1660ES
LOGIC ANALYZER
done key select key
display
movement keys
MENU
System
Config
Trigger
Listing
Done Select
Page
power on/off
data entry keys
Format
Wave­form
Clear entry
Don't care
±
.
Q A
Page
disk drive
DEF 9 567
YU
BA
NM
Run Cont
Stop
Print All
I
OP
KH
C 8 4 0123
WER T SDFGJL ZXCVB
oscilloscope channels
shift key
3
Figure 4. Configuration Screen
Figure 5. Format Screen
Run—starts data acquisition in specified trace mode.
Stop—halts acquisition and dis­plays current data.
Acquisition mode and number of channels (assign pods) are specified. Timing and State measurements can be taken simultaneously.
Activity indicators allow users to monitor device-under-test activity during analyzer setup.
User mnemonics defined (for bit patterns or ranges), or up to 1000 symbols extracted from popular object module formats. In sym­bol mode, symbols will be dis­played in place of data.
Logic threshold levels.
State speed can be specified when analyzer is in state mode. Full channel (250 MHz) or half channel (500 MHz) can be speci­fied in timing mode. (Screen shot is in state mode.)
Activity indicators.
Appropriate channels assigned to a label.
Channels can be grouped and given a 6-character label. Maximum of 126 labels with up to 32 channels each.
Agilent Technologies 1670G Series Annotated Screen Shots
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Figure 6. Trigger Screen
Ten pattern recognizers (and bit patterns in each label) can be defined.
Edge terms make it easy to trig­ger on rising or falling edges on any number of specified signals. They can also be used to trigger on glitches to 3.5 ns.
Analyzer and oscilloscope or pat­tern generator can cross-arm each other. Arming is started by Run, Group Run, or the PortIn BNC (rising edge). PortOut is asserted as a rising edge at the PortOut BNC.
Twenty-three trigger functions (shown graphically and textually) can be combined to create custom trigger sequences.
Up to twelve sequence levels with branching and timers can be defined.
Agilent Technologies 1670G Series Annotated Screen Shots
Figure 8. Listing Display
Knob (or hold down right mouse button) scrolls through listing display.
Markers measure the time between events, search for spe­cific events, and gather statistical data.
Trigger is located at line 0.
Figure 7. Graphical Trigger Function
5
Figure 9. Waveform Display
Figure 10. Chart Display (State Mode Only)
Accumulate—waveform is not erased between successive acquisitions (persistence).
All displays are time-correlated, so the trigger, x, and o markers are located at equivalent posi­tions in time on each display.
Overlay—multiple channels dis­played on one line, with value in selected base if space permits. Maximum of 24 lines per screen; may scroll through up to 96 lines.
Chart mode plots the value of a specified label (on y-axis) versus a state number or another label (on x-axis). Both axes can be scaled. Useful for A/D con­verters and obtaining a visual overview of bus activity (address flow or data flow).
Agilent Technologies 1670G Series Annotated Screen Shots
Figure 11. System Performance Analyzer (SPA)
There are three SPA modes avail­able: State Overview (shown here provides a visual indication of memory use), State Histogram (% time spent in each function), and Time Interval (execution time of a particular function).
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Figure 13. Oscilloscope Display (Option 003)
Figure 14. Pattern Generator Sequence Window (Option 004)
Several different views of the oscilloscope display are available, each offering different control options. The Scope Channel dis­play is shown here.
The pattern generator allows the user to create data streams from provided macros or from various external sources and use them to stimulate a target. Since the pat­tern generator is internal to the logic analyzer, the target response can be measured with the logic analyzer to identify incorrect output and potential target system malfunction.
Figure 12. Compare Screen
(State Mode Only)
Compare performs a post-processing, bit-by-bit comparison of acquired state data and compare image data. Copy state acquisition into com­pare image buffer (may edit any bit in compare image). The com­pare feature halves the memory depth (1/4 memory with Opt.
002)
Stop Measurement halts repeti­tive acquisitions when current and compare acquisitions are equal or not equal.
Compare Partial allows masking of a compare image in order to compare only certain bits or set ranges of states (rows). (It com­pares data that falls within enabled channels and specified range.)
Difference Listing highlights dif­ferences between the current state listing and compare image. (Reference listing shows com­pare image and bit masks.)
Agilent Technologies 1670G Series Annotated Screen Shots
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