Inspect the Probe 3
1154A Differential Probes Introduction 4
Accessories 5
Attaching External Attenuators to the Probe 7
!
Specifications and Characteristics 8
To Connect the Probe to the Circuit under Test 12
Recommended Probe Configurations 14
Safety Considerations 17
Service Strategy 17
Performance Verification 18
Adjustment of 10:1 Attenuators 32
Performance Test Record 35
2
1154A 500 MHz Differential Probe
Inspect the Probe
Inspect the Probe
❏ Inspect the shipping container for damage.
Keep a damaged shipping container or cushioning material until the contents of
the shipment have been checked for completeness and the probe has been
checked mechanically and electrically.
❏ Check the accessories.
Any accessories that were supplied with the probe are listed in “Accessories” on
page 5.
• If the contents are incomplete or damaged, notify your Agilent Sales Office.
❏ Inspect the instrument.
• If there is mechanical damage or defect, or if the probe does not operate
properly or pass performance tests, notify your Agilent Sales Office.
• If the shipping container is damaged, or the cushioning materials show signs
of stress, notify the carrier as well as your Agilent Sales Office. Keep the
shipping materials for the carrier’s inspection. The Agilent office will arrange
for repair or replacement at Agilent’s option without waiting for claim
settlement.
3
1154A 500 MHz Differential Probe
1154A Differential Probes Introduction
1154A Differential Probes Introduction
The 1154A is a wide-band differential active probe. The probe features low noise,
low input capacitance, high common mode rejection, and Field Effect Transistor
(FET) buffered inputs in the probe head. User-selectable offset gives the probe
flexibility to measure a large range of signal types. Plug-on attenuators and AC
coupling accessories further extend the application range. Included interconnect
accessories allow connection to surface mount and through-hole components
with minimal signal degradation. The input receptacles in the probe head are
compatible with standard 0.025" (0.635 mm) square pins, which provide a
convenient low-cost method of creating device characterization test fixtures.
The 1154A is ideal for acquiring high speed differential signals such as those
found in disk drive read channels, differential LAN, video, etc. The high
impedance characteristics of both inputs allow the probe to be used as a FET
probe to make single-ended measurements in digital systems without
introducing a ground loop as a conventional FET probe would.
Differential Amplifiers and CMRR
The 1154A Differential Probe is a high input impedance amplifier. A
characteristic of differential amplifiers is the ability to reject signals that are
common to the two inputs. The common mode rejection ratio (CMRR) is the
measurement of this ability. It is expressed as the ratio between the amplitudes
of the common mode and differential signals that produce equal outputs. These
measurements can be referred to the probe input, if the differential gain is
known. The CMRR is usually expressed in dB:
The CMRR is only specified for unity Gain, therefore the gain term can be ignored
in the equation shown above.
The ability to reject common mode signals depends on the balance designed into
the probe amplifier. As the frequency of the common mode signal increases, it
becomes harder to balance the amplifier parasitic parameters. This leads to
degradation of the CMRR.
The CMRR of the 1154A Differential probe is specified from the probe tip. This
method of specifying the probe CMMR eliminates the effects of source
impedance, provided the connections from the probe tip to the signal source are
symmetrical.
4
1154A 500 MHz Differential Probe
Accessories
Accessories
The following diagram and table show the accessories supplied with the 1154A
Differential Probe.
To order a replaceable part, in the United States and Canada call our toll-free
hotline at 1-877-447-7278, or call your local Agilent Technologies Sales Office.
(includes an adjustment tool)
Connection Kit101154-60004
Trimmer Tool
(0.635 mm square head)
101154-82102
15063-2196
Using the Accessories
The 1154A Differential Probe and accessories provide many ways to connect to
circuitry under test. Any method used to connect the probe signal inputs to the
circuit under test degrades the performance of the probing solution. Take the
following precautions to optimize common mode rejection.
• Maintain tip connection lead length as short as possible and the same
length.
• Follow the same path for wires used to connect the inputs of the probe
to the circuit under test.
• Probes do not have infinite input impedance and therefore load the
circuit under test. If the impedance of the test points is not identical,
unequal loading will occur. This degrades the common mode rejection.
• The ground lead length is not usually critical with a differential probe.
• Carefully consider the ground potential relative to the oscilloscope
ground potential. The potential difference must be within the common
mode range of the probe.
• The DC potential between the AC coupling adapter and the oscilloscope ground must not exceed 42 Vpk.
• Do not cascade the external attenuators.
• Cascade the external AC coupling adapter in the following order: probe,
attenuator, and AC coupling adapter.
6
1154A 500 MHz Differential Probe
Attaching External Attenuators to the Probe
Other Probe Accessories
The Agilent Wedge was designed to interface directly with the differential probe.
These devices simplify connections to surface mount integrated circuits and have
output pins compatible with the probe tip and attenuator sockets.
Attaching External Attenuators to the Probe
The external attenuators plug directly on to the probe tip. They are calibrated
at the factory to provide the optimum common mode rejection and should not
be swapped between probes.
1154A Attenuator
Div-By-10 1 GHz
1154A AC Coupler
Always Install Last
The 1154A probe’s best performance is achieved when the probe attenuation is set
to /10 in the Infiniium’s Probes Setup dialog box.
7
1154A 500 MHz Differential Probe
Specifications and Characteristics
Specifications and Characteristics
Performance Specifications
Input Configuration: Ground ConnectorTrue Differential (+ and inputs), with shield
Effective Gain*X10, X1,
LF Gain Accuracy X102% into Infinium 50 load measured at 1 kHz
LF Gain Accuracy X12% into Infinium 50 load measured at 1 kHz
LF Gain Accuracy 102% into Infinium 50 load measured at 1 kHz
Input CouplingDC/AC: Coupling obtained by installing AC Coupling
!
Maximum Input Voltage
Either input from ground
CMRR (Unity Probe Gain)at 70 Hz: 80dB
AC coupling is obtained by installing the AC coupling adapter.
÷Ω
Adapter
± 42 V either input from ground
at 100 kHz: 80dB
at 1 MHz: 60dB
at 10 MHz: 40dB
at 250 MHz: 14dB
X10, X100 (external attenuator)
÷÷
≥
≥
≥
≥
≥
–
Ω
Ω
Range
Mode÷ 1 internal
probe
attenuation
Differential with 10X Gain ± 40 mV± 400 mV± 4V
Differential with 1X Gain± 400 mV± 4 V± 40 V
Common± 4.2 V± 42 V± 42 V
÷ 10 internal
probe
attenuation
÷ 100 internal
probe
attenuation
Range when using external ÷ 10 attenuator
Mode÷ 10 internal
probe
attenuation
Differential with 10X Gain ± 4 V
Differential with 1X Gain± 40 V
Common± 40 V
8
1154A 500 MHz Differential Probe
Specifications and Characteristics
Performance Characteristics
10 Attenuation)
Probe Bandwidth
(Probe Only)
(-3 dB)
Rise Time
(Probe Only)
Input Resistance
(Each Side to Ground)
Input Capacitance
(Between Inputs)
(No External Attenuators)
Input Capacitance
(Each Side to Ground)
(No External Attenuators)
Noise
(Referred to Input, 5 - 1000 MHz)
DC to 500 MHz (
700 pS ( 10 Attenuation)
≤÷
≤÷
875 pS ( 1 Attenuation)
1 M
Ω
1.6 pF (
≤÷
3.1 pF ( 1 Attenuation)
≤÷
3 pF ( 10 Attenuation)
≤÷
6 pF ( 1 Attenuation)
≤÷
6 nVHz⁄
10 nVHz⁄
0 nVHz⁄÷
15 nVHz⁄÷
Output Impedance50 Nominal (Intended to Drive 50
Typical CMRR
ΩΩ
÷
10 Attenuation)
( 1 Attenuation, 10X Gain)
÷
÷
( 1 Attenuation, 1X Gain)
( 10 Attenuation, 10X Gain)
( 10 Attenuation, 1X Gain)
9
1154A 500 MHz Differential Probe
Specifications and Characteristics
Typical Noise
Environmental Specifications
OperatingNon-operating
Temperature0 to 50 C-40 to 75 C
HumidityUp to 80% RH at 40 CUp to 80% RH at 75 C
AltitudeUp to 4,600 meters
VibrationRandom vibration 5 to 500 Hz,
WeightApproximately 226 g
DimensionsRefer to the Dimensions drawing on page 11.
°°
°°
(15,000 feet)
10 minutes per axis, 0.3 g
Up to 15,000 meters
(50,000 feet)
Random vibration 5 to
500 Hz, 10 minutes per axis,
The method you use to connect the probe to the circuit under test is critical for
accurate measurements. The following examples examine the effect of using
different lengths of wire at 100MHz to connect the signal source to the probe tip.
Data taken at 100 MHz
Both inputs derived from a
Probe Input
Displayed Probe Output
common signal at the probe tip.
CMRR = 43.5 dB
Both signals derived from a
common signal via 5cm
coupling lead.
CMRR = 29.8 dB
12
Both inputs derived from a
common signal via leads of
different length.
Positive input 5.3 cm.
Negative input 7.5 cm.
CMRR = 28.1 dB
1154A 500 MHz Differential Probe
To Connect the Probe to the Circuit under Test
The Impedance of the Source
This is another instance where the symmetry of the differential circuit is
important. The impedance of the source forms a network with the input
impedance of the connection and the probe. This network determines the
frequency response for the measurement. If each side of the differential source
has a different impedance, the frequency response of each side will be different.
This lack of balance is reflected in reduced CMRR. The higher the impedance of
the source, the more critical these parasitic effects.
The Ground Connection
A poorly located ground connection allows ground loops to add to the common
mode signal. The differential probe measures the potential difference between
two locations on a PC board. Usually it is not necessary to ground the probe.
Whether you ground the probe depends on the magnitude and frequency of the
voltage difference between the oscilloscope ground and the board ground. It is
good practice to maintain a board ground. Without this ground reference, you
can easily exceed the common mode range of the probe.
Selecting the Best Mode of Operation
The 1154A probe has some unique features, allowing the probe to be optimized
for many commonly encountered measurements. To apply these features, an
understanding of the probe’s block diagram is helpful.
13
1154A 500 MHz Differential Probe
ччччч
÷
Recommended Probe Configurations
Probe Attenuation or Gain Within the probe tip of the 1154A is a
selectable 10:1 passive attenuator. The control unit has a selectable gain of 1 or
10. This gives the following combinations of attenuation and gain.
Internal Probe Gain Internal Probe AttenuatorResultant Gain or
Attenuation
10110
10101
111
110 1/10
Note When the probe is switched from 1 to 10 there is a small change in probe
input impedance. The external 10 attenuator has been adjusted to give
optimum performance when the internal probe attenuator is set to 10. When
the Tip Adapters are used, there is some loss of CMRR. To obtain the maximum
dynamic range, use the 10 adapter with the internal 10 attenuator. This is a
significant advantage as the 10 Gain can be used in this mode, giving a
×
÷
combined gain of only 10.
Recommended Probe Configurations
For best performance, use the following configurations. They are presented in
the recommended order from the most desirable to the least.
NoteThe use of the ground connection is optional for all configurations.
Direct Connection
1154A Probe Tip
Test Point Layout
See the “Test Point Layout”
section for more
informa tion
14
1154A 500 MHz Differential Probe
Recommended Probe Configurations
AC Adapter/Attenuator
Use the attenuator shipped with the probe and marked with the same serial
number for accurate measurements. Do not use the attenuators with other
probes.
1154A Attenuator
Div-By-10 1 GHz
1154A AC Coupler
Always Install Last
Offset Pins
You may use offset pins with any of the tip adapters.
Offset Pins Rotate
to Adjust Sp acing
SMT Lead
You may use SMT leads with any of the tip adapters.
Test Point Layout
See the “Test Point Layout”
section for more information
SMT Leads
Maintain Equal
Length
Solder Leads
to Test Points
Ground
Ground Lead
Opt
15
1154A 500 MHz Differential Probe
Recommended Probe Configurations
Wire Leads
You may use wire leads with any of the tip adapters.
Connec t Leads to
Test Points
Ground
Opt
Grabbers
Using grabbers and wire leads results in significant lead length. Expect
measurement quality degradation with fast signals.
0.5 mm or 0.8 mm
Grabbers
Ground
Opt
Test Point Layout
16
1154A 500 MHz Differential Probe
Safety Considerations
Safety Considerations
Read the Safety summary in the warranty pages at the back of this guide before
servicing the instrument. Before performing any procedure, review the safety
information for cautions and warnings.
WARNING Trained service personnel aware of the hazard involved (for example, fire and
electric shock) should perform maintenance on the instrument. When
!
maintenance can be performed without power applied, the power cord must be
removed from the instrument.
Service Strategy
To return the 1154A Differential Probe to optimum per formance requires factory
repair. All probes must be returned to the service group for repair and calibration.
If the probe is under warranty, normal warranty services apply. If the probe is
not under warranty, you may exchange a failed probe for a reconditioned one at
a nominal cost.
To Return the Probe to Agilent for Service
Call (877) 447-7278 for further details and the location of your nearest Agilent
Service Office.
1
Write the following information on a tag and attach it to the probe.
• Name and address of owner.
• Probe model number.
• Probe serial number.
• Description of the service required or failure indications.
2 Return the following accessories with the probe:
• Attenuators
• AC coupling adapter
Retain all other accessories.
3
Return the probe in its case or pack the probe in foam or other shock
absorbing material and place it in a strong shipping container.
You can use the original shipping materials or order materials from an Agilent
Sales Office. If neither are available, place 3 to 4 inches of shock-absorbing
material around the instrument and place it in a box that does not allow
movement during shipping.
4
Seal the shipping container securely.
5 Mark the shipping container as FRAGILE.
In all correspondence, refer to the instrument by model number and full serial
number.
17
1154A 500 MHz Differential Probe
Performance Verification
Performance Verification
Use this procedure to verify the warranted characteristics of the 1154A
Differential Probe. The recommended performance calibration interval for the
1154A is one year. Perform the complete performance verification procedure as
the first step of annual certification. You can complete the performance
verification without removing the probe covers. There are no user adjustments
available for calibration. Use the equipment shown in the “Test Equipment
Required” section to complete the performance verification procedures.
1
Perform the steps listed in the “Preliminary Procedure” section on
page 19.
2 Perform the steps listed in the “Test Gain Accuracy at 1kHz” section on
page 24.
3 Perform the steps listed in the “Test Offset” section on page 25.
4 Perform the steps listed in the “Test Differential Mode Range” section
on page 26.
5 Perform the steps listed in the “CMRR Test” section on page 27.
Test Equipment Required
DescriptionMinimum RequirementsTest Equipment
Infinium Oscilloscope1.5 GHz54845A
Digital AC/DC VoltmeterDC: 0.1% accuracy
Turn on the oscilloscope, the 1154A, and the other test equipment
described in the “Test Equipment Required” section on page 18.
Allow 30 minutes for all test equipment to warm up.
2
Press Default Setup.
3 Perform Probe Tip Cal on the 1161A connected to CH4 of the
oscilloscope (54845A).
4 Save the setup files listed below to the C drive of the 54845A.
These setups can also be saved to drive A and filed for future use.
Performance Verification Setup Files
Save the setup information shown below for the various performance verification
tests to the specified file names on the C drive of the 54845A or to a floppy disk
in drive A.
Setup for Differential Mode Range
File Name: 1154ACAL0
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 and CH4 Sensitivity200 mV/div
CH2 and CH3Off
Offset and Position CH1, CH2, CH3 and CH40 V
Measurements: CH1 and CH4V amplitude under Measure Voltage
Timebase500 Sec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 8 averages
TriggerCH4: level 0 V
ProbeFirst Test: Att 1; Gain 1
Second Test: Att 1/10; Gain 10
×
19
1154A 500 MHz Differential Probe
µ
Performance Verification
Setup for CMRR at 70 Hz
File Name: 1154ACAL1
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 Sensitivity2 mV/div
CH4 Sensitivity5 V/div
CH2 and CH3Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase10 mSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4; level 0 V
ProbeAtt 1; Gain 1
××
Setup for CMRR at 100 kHz
File Name: 1154ACAL2
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 Sensitivity2 mV/div
CH4 Sensitivity5 V/div
CH2 and CH3Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase5 Sec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4: level 0 V + ve edge
ProbeAtt 1; Gain 1
××
20
1154A 500 MHz Differential Probe
Performance Verification
Setup for CMRR at 1 MHz
File Name: 1154ACAL3
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 Sensitivity10 mV/div
CH4 Sensitivity5 V/div
CH2, CH3, and CH4Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase500 nSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4; level 0 V
ProbeAtt 1; Gain 1
××
Setup for CMRR at 10 MHz
File Name: 1154ACAL4a
Probe Connected to CH1None
Probe Connected to CH41161A
CH1 Sensitivity (50 )200 mV/div
CH4 Sensitivity200 mV/div
CH2, CH3, and CH4Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase100 nSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4; level 0 V
ProbeAtt 1; Gain 1
Ω
××
21
1154A 500 MHz Differential Probe
Performance Verification
Setup for CMRR at 10 MHz
File Name: 1154ACAL4b
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 Sensitivity2 mV/div
CH4 Sensitivity200 mV/div
CH2, CH3, and CH4Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase100 nSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4; 0 V + ve trig
ProbeAtt 1; Gain 1
××
Setup for CMRR at 250 MHz
File Name: 1154ACAL5a
Probe Connected to CH1None
Probe Connected to CH41161A
CH1 Sensitivity200 mV/div
CH2, CH3, and CH4Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase2 nSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 64 averages
TriggerCH4; 0 V + ve trig
ProbeAtt 1; Gain 1
××
22
1154A 500 MHz Differential Probe
Performance Verification
Setup for CMRR at 250 MHz
File Name: 1154ACAL5b
Probe Connected to CH11154A
Probe Connected to CH41161A
CH1 Sensitivity50 mV/div
CH2, CH3, and CH4Off
Offset and Position CH1, CH2, CH3 and CH40 V
Timebase2 nSec/div
Timebase Delay0 Sec
Setup AcquisitionEquivalent time: 16 averages
TriggerCH4: 0 V + ve edge
ProbeAtt 1; Gain 1
××
23
1154A 500 MHz Differential Probe
Performance Verification
Test Gain Accuracy at 1kHz
Set up the test equipment as shown in the following diagram.
1
Select Auto Zero on the probe menu.
The probe tip must not be connected to a signal source when Auto Zero is
performed.
2
Set the test equipment as shown in the following table.
Test Equipment Settings
Test EquipmentSetting
Function generator frequency: 1 kHz
output amplitude: 200 mV
offset: 0 V
Probeattenuator: 1 (See probe set up menu)
gain: 1:1 (See probe set up menu)
Sine Wave
RMS
3 Connect the probe tip to the probe input A of the calibration fixture.
4 Set the output of the function generator DVM (RMS mode) at the
calibration fixture to approximately 200 mV
RMS
(V1).
Record V1: ___________________ .
24
1154A 500 MHz Differential Probe
Performance Verification
5 Measure probe output with the same DVM at Intelligent Interface.
Record V2: ___________________ .
6
Calculate the % gain error.
(% Gain Error = 100(V2 - V1)/V1). Record % Gain Error: ___________________ .
7
Record the % Gain Error in the Performance Test Record on page 35.
8 Repeat steps 4 - 7. Use the following probe settings.
Probe Settings
Attenuator1/10 (See probe set up menu)
Gain10 (See probe set up menu)
Test Offset
This is an important step in the performance verification process. You should
perform it, even though no data is recorded in the Performance Test Record.
1
Disconnect the probe tip from the calibration fixture.
2 Set the probe gain to 1 using the Channel Set Up menu.
3 Select Auto Zero under the probe menu.
4 Measure the probe output (at BNC T of the Intelligent Interface) with
×
DVM DC mode.
NoteThe DVM reading should be approximately 2mV or less. This is not a warranted
specification.
25
1154A 500 MHz Differential Probe
Performance Verification
Test Differential Mode Range
Use setup file 1154ACAL0 for this test. Setup the test equipment as shown in
the following diagram.
1
Press Default Setup.
2 Disconnect the intelligent interface.
3 Connect the 1154A to CH1 of the oscilloscope.
4 Load 1154ACAL0.
5 Connect the 1161A from BNC T (connected to the function generators
output) to CH4 of the oscilloscope.
6 Setup the test equipment as shown in the following table.
Test EquipmentSetting
Function generatorfrequency: 1 kHz
output amplitude: 800 mV
7 Select Auto Zero under the probe menu.
Do not connect the probe tip or the function generator to the fixture when Auto
Zero is performed.
8
Measure the amplitude on CH4.
26
pp
1154A 500 MHz Differential Probe
Performance Verification
9
Connect a coaxial cable from BNC T (connected to the function
generator) to Calibration fixture A.
10 Connect the 1154A probe tip to the calibration fixture.
11 Record “Pass” in the “Differential Mode Range” section of the
Performance Test Record on page 35 if no clipping occurs. Record
“Fail” if visible clipping occurs.
12 Repeat steps 6 - 10. Use the following probe settings.
Probe Settings
Attenuator1/10 (See probe set up menu)
Gain10 (See probe set up menu)
CMRR Test
Use setup files1154ACAL1 through 1154ACAL5b to perform the CMRR tests.
Use the information in the following sections to test CMRR at 70 Hz, 100 kHz, 1
MHz, 10 MHz, and 250 MHz.
Set the test equipment as shown in the following diagram.
×
Test CMRR at 70 Hz Use setup file 1154ACAL1 in this test. Press Clear
Display before starting each test. Wait for averaging to complete before taking
readings. If only a short time has elapsed from the last AUTO-ZERO calibration
this step may be omitted.
27
1154A 500 MHz Differential Probe
Performance Verification
1 Set the function generator as shown in the following table.
SettingValue
Output Level20 V
Frequency70 Hz Sine Wave
pp
2 Load setup file 1154ACAL1.
3 Connect the 1161A to the function generator output and CH4 of the
oscilloscope.
4 Connect the 1154A probe to the CH C probe input of the calibration
fixture.
5 Set the 1154A probe gain and attenuation to 1.
6 Select Auto Zero under the probe menu.
Do not connect a signal to the probe tip of the fixture during Auto Zeroing.
7
Connect the function generator to Channel C BNC of the calibration
fixture.
8 Measure the amplitude of the function generator output (CH4).
Record V1:_____________
9
Measure the amplitude of CH1.
The signal may be too small for an accurate reading. In this case, the reading
obtained is less than that required to meet the CMRR specification.
Record V2:_____________
Calculate CMRR.
10
V2 amplitude
--------------------------------
CMRR20
log=
V1 amplitude
11 Record CMRR in the “CMRR at 70 Hz” section of the Performance Test
Record on page 35.
NoteCMRR must be 80dB or greater.
Test CMRR at 100 kHz Use setup file 1154ACAL2 in this test.
1
Set the function generator as shown in the following table.
SettingValue
Output Level20 V
Frequency100 kHz Sine Wave
Offset0 V
pp
2 Disconnect the function generator from the BNC calibration fixture.
3 Load setup file 1154ACAL2.
28
4 Perform Auto Zero under the probe menu.
Do not connect a signal to the probe tip of the calibration fixture during Auto
Zeroing.
5
Connect the function generator to CHANNEL C BNC on the calibration
fixture.
6 Measure the amplitude of the function generator output (CH4).
Record V1:_____________
7
Measure the amplitude of CH1.
Record V2:_____________
8
Calculate CMRR.
CMRR20
9 Record CMRR in the “CMRR at 100 kHz” section of the Performance
Test Record on page 35.
NoteCMRR must 80dB or greater.
Test CMRR at 1 MHz Use setup file 1154ACAL3 in this test.
1
Set the function generator as shown in the following table.
1154A 500 MHz Differential Probe
V2 amplitude
--------------------------------
log=
V1 amplitude
Performance Verification
SettingValue
Output Level20 V
Frequency1 MHz
2 Disconnect the function generator from the BNC calibration fixture.
3 Load setup file 1154ACAL3.
4 Select Auto Zero under the probe menu.
Do not connect a signal to the probe tip of the calibration fixture during Auto
Zeroing.
5
Connect the function generator to BNC C on the calibration fixture.
6 Measure the amplitude of the function generator output (CH 4).
Record V1:_____________
7
Measure the amplitude of CH1.
Record V2:_____________
8
Calculate CMRR.
pp
CMRR20
V2 amplitude
--------------------------------
log=
V1 amplitude
29
1154A 500 MHz Differential Probe
Performance Verification
9 Record CMRR in the “CMRR at 1 MHz” section of the Performance Test
Record on page 35.
NoteCMRR must 60 dB or greater.
Test CMRR at 10 MHz Use setup files 1154ACAL4a and 1154ACAL4b in this
test.
1
Set the signal generator as shown in the following table.
SettingValue
Output Level5 dBm
Frequency10 MHz
2 Disconnect the 1154A probe from the CH1 and connect it to CH2 to
maintain a constant temperature.
3 Load setup file 1154ACAL4a.
4 Connect the signal generator to CH1 on the oscilloscope.
5 Measure the amplitude of the signal generator output.
Record V1:_____________
6
Remove the signal generator from CH1.
7 Remove the 1154A probe from CH2 and connect it to CH1.
8 Select Auto Zero under the probe menu.
Do not connect the probe tip to the calibration fixture during Auto Zeroing.
9
Connect the signal generator to BNC D of the calibration fixture.
10 Load setup file 1154ACAL4b.
11 Connect the 1154A probe to BNC D on the calibration fixture.
12 Measure the maximum value of CH1.
Record V2:_____________
13
Calculate CMRR.
CMRR20
14 Record CMRR in the “CMRR at 10 MHz” section of the Performance
Test Record on page 35.
V2 amplitude
--------------------------------
log=
V1 amplitude
NoteCMRR must 40 dB or greater.
30
1154A 500 MHz Differential Probe
Performance Verification
Test CMRR at 250 MHz Use setup files 1154ACAL5a and 1154ACAL5b in
this test.
1
Set the signal generator as shown in the following table.
SettingValue
Output Level5 dBm
Frequency250 MHz
2 Disconnect the 1154A probe from the CH1 and connect it to CH2 to
maintain a constant temperature.
3 Load setup file 1154ACAL5a.
4 Connect the signal generator to CH1 on the oscilloscope.
5 Measure the amplitude of the signal generator output.
Record V1:_____________
6
Remove the signal generator from CH1.
7 Remove the 1154A probe from CH2 and connect it to CH1.
8 Select Auto Zero under the probe menu.
Do not connect the probe tip to the calibration fixture during Auto Zeroing.
9
Connect the signal generator to BNC D of the calibration fixture.
10 Load setup file 1154ACAL5b.
11 Connect the 1154A probe to D on the calibration fixture.
12 Measure the maximum value of CH1.
Record V2:_____________
13
Calculate CMRR.
V2 amplitude
--------------------------------
CMRR20
14 Record CMRR in the “CMRR at 250 MHz” section of the Performance
log=
V1 amplitude
Test Record on page 35.
NoteCMRR must 14 dB or greater.
31
1154A 500 MHz Differential Probe
Adjustment of 10:1 Attenuators
Adjustment of 10:1 Attenuators
A 10:1 attenuator is supplied with the 1154A probe. This attenuator is matched
to the probe and should require no further adjustment. The attenuator is labeled
with the last four digits of the probe serial number. Identify matching probes and
attenuators using these numbers. If you purchase new attenuators for the probe,
you must adjust them to match the probe.
Optimizing CMRR for an Attenuator
For optimum CMRR when the attenuator is connected to the probe, the DC and
HF attenuation should be the same for both active inputs of the probe. Three
trimmers are provided in the attenuator to match the two active inputs. The
adjustments are located under the serial number label. Apply a new label after
calibration and mark this label with the last four digits of the probe’s serial
number. You should only adjust an attenuator if it is not the original attenuator
shipped with the probe.
You may remove the attenuator’s plastic covers. Take care not to damage the
probe attenuator pins.
32
1154A 500 MHz Differential Probe
Adjustment of 10:1 Attenuators
10:1 Attenuator Adjustment Procedure
Use the following steps to adjust the 10:1 attenuator.
1
Connect the function generator, probe and oscilloscope as shown.
Connect the + active probe input to the function generator output for these
tests. Connect the active input to ground with the probe ground socket.
–
2
Connect the 1154A Probe to CH1 of the oscilloscope.
3 Turn on the test equipment.
Allow 30 minutes for the probe to warm up.
4
Place the 10:1 attenuator on the 1154A probe.
Do not connect a signal to the probe at this time.
5
Set the function generator as shown in the following table.
Use a function with a flat top for this test.
SettingValue
Square Wave Output Amplitude1 V
Frequency5 kHz
Offset0 V
6
Select Auto Zero on the probe menu.
Do not connect the probe tip to the calibration fixture during Auto Zeroing.
33
1154A 500 MHz Differential Probe
–
Adjustment of 10:1 Attenuators
7
Connect the 1154A probe as shown.
Use the clips to make these connections. The frequency being considered has a
fundamental of 5kHz. Connect the + probe input to the signal source. Connect
the probe input to ground.
–
8
Set the oscilloscope time base to 500 nS/div.
9 Press Auto Scale to set the 54845A to trigger off Ch4.
10 Use the square head trimmer tool to adjust the +LF comp to achieve the
best square corner and flat top of the displayed waveform.
Adjust so that the signal characteristics are correct when you remove the
adjustment tool.
11
Connect the + and probe inputs to the function generator output while
–
the probe ground is connected to the function generator ground.
You can use the calibration fixture BNC to make these connections.
12
Set the function generator to 50 Hz and the output to 10 V amplitude.
The 1161A CH 4 will show this amplitude.
13
Set the oscilloscope time base to 5 mS/div.
14 Set Ch1 sensitivity to maximum.
15 Adjust DC attenuator balance for the minimum square wave amplitude.
The phase of the signal will change by 180 as you adjust the balance control
through zero.
16
Set the function generator to 5 kHz and amplitude to 1 Vpp.
17 Connect the Probe input to the function generator’s output and the +
–
°
input to ground (calibration fixture BNC A).
Maintain the probe ground.
18
Press Auto Scale.
19 Use the square head trimmer tool to set the LF compensation for a
minimum of overshoot or undershoot at the leading edge of the
waveform.
The correct adjustment is achieved when the wave-form has a flat top. Adjust
so that the signal characteristics are correct when you remove the adjustment
tool.
20
Set the oscilloscope time base to 500 nS/div.
21 Connect the probe + input and inputs to the function generator
–
output.
You may use BNC C on the calibration fixture. Connect the probe ground to the
function generator ground.
22
Set the function generator as shown in the following table.
SettingValue
Amplitude10 V
Frequency5 kHz
34
1154A 500 MHz Differential Probe
Performance Test Record
23
Set the oscilloscope sensitivity to maximum.
24 Use the square head trimmer tool to adjust the LF compensation for
–
minimum signal amplitude.
It is not possible to make the trace completely flat.
Performance Test Record
Agilent Technologies
Recommended Test Interval: 1 Year
Recommended Date of Next Certification:_________
Certification Temperature:_____________________
Product Name:Active Differential Voltage Probe
Model Number(s):1154A
Product Option(s):All
conforms to the following Product Specifications:
Safety:IEC 1010-1:1990+A1 / EN 61010-1:1993
UL 3111
CSA-C22.2 No. 1010.1:1993
EMC:CISPR 11:1990 / EN 55011:1991 Group 1, Class A
IEC 555-2:1982 + A1:1985 / EN60555-2:1987
IEC 555-3:1982 + A1:1990 / EN 60555-2:1987 + A1:1991
IEC 801-2:1991 / EN 50082-1:1992 4 kV CD, 8 kV AD
IEC 801-3:1984 / EN 50082-1:1992 3 V/m, {1kHz 80% AM, 27-1000 MHz}
IEC 801-4:1988 / EN 50082-1:1992 0.5 kV Sig. Lines, 1 kV Power Lines
Supplementary Information:
The product herewith complies with the requirements of the Low Voltage Directive 73/23/EEC
and the EMC Directive 89/336/EEC, and carries the CE-marking accordingly.
This product was tested in a typical configuration with Agilent test systems.
1900 Garden of the Gods Road
Colorado Springs, CO 80907, U.S.A.
Colorado Springs, 1/12/2000
Ken Wyatt, Quality Manager
European Contact: Your local Agilent Technologies Sales and Service Office
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shall not apply to defects
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certifies that this product
met its published
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measurements are traceable
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National Institute of
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Institute's calib ration
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Organization m embers.
Agilen t Technologies
P.O. Box 2197
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Safety
This apparatus has been
designed and tested in
accordance with IEC
Publication 1010, Safe ty
Requirements for
Measuring Apparat us, and
has been supplied in a safe
condition. To ensure safe
operation and to keep the
product safe, the
information, cautions, and
warnings in this operating
manual must be heeded. In
addition, note the external
markin gs on the instrument
that are described under
"Safet y Symbols."
Safety Symbols
!
Instruction manual symbol:
the product is marked with
this symbol when it is
necessary for you to refer to
the instruction manual in
order to protect against
damage to the product.
Hazardous voltage symbol.
Earth terminal symbol:
Used to indicate a circuit
common connected to
grounded chassis.
WARNING
The Warning sign denotes a
hazard . It calls at tention to
a procedure, practice, or
the like, which, if not
correctly performed or
adhered to, could result in
personal injury. Do not
proceed beyon d a Warning
sign until the indicated
conditions are fully
understood and met.
CAUTION
The Caution sign denotes a
hazard . It calls at tention to
an operating procedure,
practice, or the like, which,
if not correctly performe d
or adhered to, could result
in damage to or destruction
of part or all of the product.
Do not proceed beyond a
Caution symbol until the
indicated conditions are
fully understood or met.
About this edition
This is the 1154A
Differential Voltage Probe
User’s Guide.
Publication number
01154-92000, Feb. 2000
Printed in USA.
Print history is as follows:
01154-92000, Feb. 2000
New editions are complete
revisions of the manual.
Many product updates do
not require manual
changes; and, conversely,
manual corrections may be
done without accompanying
product changes.
Therefore, do n ot expect a
one-to-one correspondence
between product updates
and manual updates.
s1
Agilent Technologies
Printed in the USA
Manual Part Number
01154-92000
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