AGERE 1417K5A Datasheet

Data Sheet

August 2001

NetLight

®

1417K5A 2.5 Gbits/s

1300 nm Laser Transceiver with Clock and Data Recovery

Applications

■

SONET SR OC-48, SDH I-16 applications

■

High-speed, optical data inte rface for shelf-to-shel f
interconnect

Description

Available in a small form factor, RJ-45 size, plastic package,
the 1417K5A Transceiver is a high- performance, cost-effec­tive, optical transceiver for SONET/SDH application s.

Features

■

Small form factor, RJ-45 size, 20-pin package

■

LC duplex receptacle

■

Uncooled 1300 nm laser transmitter with automatic
output power control

■

Transmitter disable input

■

Wide dynamic range receiver with InGaAs PIN
photodetector

■

Recovered clock outputs

■

TTL signal-detect output

The 1417K5A transceiv er i s a hi gh- speed, cost-effec­tive optical transceiver intended for 2.488 Gbits/s
shelf-to-shelf optical interconnect appli cations as well
as SONET SR OC-48 and SDH I-16. The transceiver
features proven Agere Systems optics and is pack­aged in a narrow-width plastic housing with an LC
duplex receptacle. The receptacle fits into an RJ-45
form factor outline. The 20-pin package pinout con­forms to a multisource transceiver agreement.

The transmitter f eatures the abil ity to interf ace to both
LVPECL and CML differential logic level data inputs.
The transmitter also f eatures a TTL logic le v el disab le
input and laser bias and back-facet monitor outputs.
The receiver f eatu res diff erential CML logic le v el data
and clock outputs, a TTL logic level signal-detect out­put and direct access to the PIN photodetector bias
input for photocurrent monitoring purposes.

■

Low power dissipation

■

Single 3.3 V power supply

■

LVPECL/CML compatible data inputs and CML
compatible data outputs

■

Operating temperature range: 0 °C to
70 °C

■

Agere Systems Inc. Reliability and Qualification
Program for built-in quality and reliability

NetLight

1417K5A 2.5 Gbits/s Data Sheet

1300 nm Laser Transceiver with Clock and Data Recovery August 2001

Absolute Maximum Rat ings

Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are abso­lute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operations sections of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.

Parameter Symbol Min Max Unit

Supply Voltage V
Operating Temperature Range T
Storage Temperature Range T

CC

stg

05V

C

070°C

–40 85 °C
Lead Soldering Temperature/Time — — 250/10 °C/s
Operating Wavelength Range λ 1.1 1.6 µm

Qualification and Reliabilit y

To help ensure high product reliability and customer satisfaction, Agere Systems is committed to an intensive qual­ity program that starts in the design phase and proceeds through the manufacturing process. Optoelectronic mod­ules are qualified to Agere Systems internal standards as well as other appropriate industry standards using MIL­STD-883 test methods and procedures, and using sampling techniques consistent with

In addition, Agere Systems has been certified to be in full compliance with the latest

Telcordia

ISO

®

Standards.

®

requirements.

-9001 Quality System

Pin Information

R

678910

1514131211

12345

2019181716

X

T

X

Figure 1. 1417K5A Transceiver, 20-Pin Configuration (top view)

1-967(F).d

2 Agere Systems Inc.

Data Sheet

NetLight

1417K5A 2.5 Gbits/s

August 2001 1300 nm Laser Transceiver with Clock and Data Recovery

Pin Information

Table 1. Transceiver Pin Descriptions

Pin

Symbol Name/Description Logic Family

Number

MS MS

1V

2V
3V

PD

EER
EER

4CLK–

5CLK+

6V
7V

EER

CCR

8SD

9RD–

10 RD+

11 V
12 V
13 T

CCT

EET

DIS

14 TD+

15 TD–
16 NIC
17 B

18 B

19 P

20 P

MON

MON

MON

MON

Receiver

Mounting Studs.

The mounting studs are provided for transceiver
mechanical attachment to the circuit board. The y ma y also provi de an
optional connection of the transceiver to the equipment chassis
ground.

Photodetector Bias Input.

This lead supplies bia s for the PIN photo-

detector diode

Receiver Signal Ground.
Receiver Signal Ground.
Received Recovered

Clock

Out.

The rising edge occurs at the rising
edge of the Receiv e d Da ta outp ut. T he falling edge occurs in the mid­dle of the Received Data baud period.

Received Recover Clock Out.

The falling edge occurs at the rising
edge of the Received Data output. The rising edge occurs in the mid­dle of the Received Data baud period.

Receiver Signal Ground.
Receiver Power Supply.
Signal Detect.

Normal operation: logic 1 output.
Fault condition: logic 0 output

Received

DAT A

Out.

Received DATA Out.

Transmitter
Transmitter Power Supply.
Transmitter Signal Ground.
Transmitter Disable.
Transmitter DATA In

. An internal 50 Ω termination is provided, con-

sisting of a 100 Ω resistor between the TD+ and TD– pins.

Transmitter

DATA

In

. See TD+ pin for terminations. LVPECL/CML

No Internal Connection.
Laser Diode Bias Current Monitor, Negative End.

–

The laser bias
current is accessible as a dc voltage by measuring the voltage devel­oped across pins 17 and 18.

Laser Diode Bias Current Monitor, Positive En d.

+

Optional feature;

if not used, do not connect. See pin 17 description.

Laser Diode Optical Power Monitor, Negative End.

–

Optional fea­ture; if not used, do not connect. The back-facet diode monitor cur­rent is accessible as a voltage proportional to the photocurrent
through a 200 Ω resistor between pins 19 and 20.

Laser Diode Optical Power Monitor, Positive End.

+

Optional fea-

ture; if not used, do not connect. See pin 19 description.

NA

NA

NA
NA

CML

CML

NA
NA

LVTTL

CML
CML

NA
NA

LVTTL

LVPECL/CML

NA
NA

NA

NA

NA

Agere Systems Inc. 3

NetLight

1417K5A 2.5 Gbits/s Data Sheet

1300 nm Laser Transceiver with Clock and Data Recovery August 2001

Electrostatic Discharge

Caution: This device is susceptible to damage as

a result of electrostatic discharge (ESD).
Take proper precautions during both
handling and testing. Follow
dard

EIA

-625.

EIA

®

Stan-

Although protection circuitry is designed into the
device, take proper precautions to avoid exposure to
ESD.

Agere Systems employs a human-body model (HBM)
for ESD susceptibility testing and protection-design
evaluation. ESD voltage thresholds are dependent on
the critical parameters used to define the model. A
standard HBM (resistance = 1.5 kΩ, capacitance =
100 pF) is widely used and, therefore, can be used for
comparison purposes. The HBM ESD threshold
established for the 1417K5A transceiver is ±1000 V.

Application Information

The 1417 receiver section is a highly sensitive fiber­optic receiver. Although the data outputs are digital
logic levels (CML), the device should be thought of as
an analog component. When laying out system appli­cation boards, the 1417 transceiver should receive the
same type of consideration typicall y given t o a sensitiv e
analog component.

Printed-Wiring Board Layout Consider­ations

A fiber-optic receiver employs a very high gain, wide­bandwidth transimpedance amplifier. This amplifier
detects and amplifies signals that are only tens of nA in
amplitude when the receiver is operating near its sensi­tivity limit. Any unwanted signal currents that couple
into the receiver circuitry cause a decrease in the
receiver's sensitivity and can also degrade the perfor­mance of the receiver's signal detect (SD) circuit. To
minimize the coupling of unwanted noise into the
receiver, careful attention must be given to the printed­wiring board.

At a minimum, a double-sided printed-wiring board
(PWB) with a large component-side ground plane
beneath the transceiver must be used. In applications
that include many other high-speed devices, a multi­layer PWB is highly recommended. This permits the
placement of power and ground on separate layers,
which allows them to be isolated from the signal lines.

Multilayer construction also permits the routing of sen­sitive signal traces away from high-level, high-speed
signal lines. To minimize the possibility of coupling
noise into the receiver section, high-level, high-speed
signals such as transmitter inputs and clock lines
should be routed as far away as possible from the
receiver pins.

Noise that couples into the receiver through the power
supply pins can also degrade performance. It is
recommended that a pi filter, shown in Figure 4, be
used for both the transmitter and receiver power
supplies.

Data, Clock, and Signal Detect Outputs

Due to the high switching speeds of CML outputs,
transmission line design must be used to interconnect
components. To ensure optimum signal fidelity, both
data outputs should be terminated identically. The sig­nal lines connecting the data outputs to the ne xt device
should be equal in length and have matched imped­ances. Controlled impedance stripline or microstrip
construction must be used to preserve the quality of
the signal into the next component and to minimize
reflections back into the receiver, which could degrade
its performance. Excessive ringing due to reflections
caused by improperly terminated signal lines makes it
difficult for the component receiving these signals to
decipher the proper logic levels and can cause transi­tions to occur where none was intended. Also, by mini­mizing high-frequency ringing, possible EMI problems
can be avoided.

The signal-detect output is positiv e LVTTL logic. A logic
low at this output indicates that the optical signal into
the receiver has been interrupted or that the light level
has fallen below the minimum signal-detect threshold.
This output should not be used as an error rate indica­tor, since its switching threshold is determined only by
the magnitude of the incoming optical signal.

SINGLE ENDED

V

OH

DATA/CLOCK

V

OL

DIFFERENTIAL

V

OH

DATA/CLOCK

V

OL

1-1089F.a

Figure 2. Data Input/Output Logic Level Definitions

4 Agere Systems Inc.

Data Sheet

NetLight

1417K5A 2.5 Gbits/s

August 2001 1300 nm Laser Transceiver with Clock and Data Recovery

Application Information

(continued)

Transceiver Processing

When the process plug is placed in the transceiver's optical port, the transceiver and plug can withstand normal
wave soldering and aqueous spray cleaning processes. However, the transceiver is not hermetic, and should not
be subjected to immersion in cleaning solvents. The transceiver case should not be exposed to temperatures in
excess of 125 °C. The transceiver pins can be wave soldered at 250 °C for up to 10 seconds. The process plug
should only be used once. After removing the process plug from the transceiver, it must not be used again as a
process plug; however, if it has not been contaminated, it can be reused as a dust cover.

Transceiver Optical and Electrical Characteristics

Table 2. Transmitter Optical and Electrical Characteristics

Parameter Symbol M in Max Unit

Average Optical Output Power (EOL) P
Optical Wavelength λ
Spectral Width ∆λ
Dynamic Extinction Ratio EXT 8.2 — dB
Output Optical Eye Compliant with SONET GR-253-CORE and

Power Supply Current I
Input Data Voltage:

Single Ended*

Differential*
Transmit Disable Voltage
Transmit Enable Voltage

†

†

Laser Bias Voltage V
Laser Back-Facet Monitor Voltage V

* 50 Ω load, measured single ended. Differential operation is necessary for optimum performance. (See Figure 2 for visual representation.)
† TTL compatible interface.

(T

= 0 °C to 70 °C; VCC = 3.135 V—3.465 V)

A

O

C

RMS

–10.0 –3.0 dBm

1266 1360 nm

—4nm

ITU-T G.957 Eye Mask Requirements

V
V

CCT

INp-p
INp-p

V

V

BIAS

D

EN

BF

—150mA

150
300

VCC – 0.9 V

EE

V

800

1600

CC

VEE + 0.8 V

0.0 0.7 V

0.01 0.2 V

mVp-p
mVp-p

V

Agere Systems Inc. 5