113 RadHard MSI Logic
UT54ACS165/UT54ACTS165
Radiation-Hardened
8-Bit Parallel Shift Registers
FEATURES
Complementary outputs
Direct overriding load (data) inputs
Gated clock inputs
Parallel-to-serial data conversions
radiation-hardened CMOS
- Latchup immune
High speed
Low power consumption
Single 5 volt supply
Available QML Q or V processes
Flexible package
- 16-pin DIP
- 16-lead flatpack
DESCRIPTION
The UT54ACS165 and the UT54ACTS165 are 8-bit serial shift registers that, when clocked, shift the data toward serial output QH. Parallel-
in access to each stage is provided by eight individual data inputs that
are enabled by a low level at the SH/LD input. The devices feature a
clock inhibit function and a complemented serial output QH .
Clocking is accomplished by a low-to-high transition of the CLK input
while SH/LD is held high and CLK INH is held low. The functions of
the CLK and CLK INH (clock inhibit) inputs are interchangeable.
Since a low CLK input and a low-to-high transition of CLK INH will
also accomplish clocking, CLK INH should be changed to the high
level only while the CLK input is high. Parallel loading is disabled
when SH/LD is held high. Parallel inputs to the registers are enabled
while SH/LD is low independently of the levels of CLK, CLK INH or
SER inputs.
The devices are characterized over full military temperature range of
-55 C to +125 C.
FUNCTION TABLE
Note:
1. Qn = The state of the referenced output one setup time prior to the Low-toHigh clock transition.
PINOUTS
16-Pin DIP
Top View
16-Lead Flatpack
Top View
LOGIC SYMBOL
INPUTS INTERNAL
OUTPUTS
OUTPUTS
SH/LDCLK
INH
CLK SER PARALLEL
A . . . H
QAQBQHQ
H
L X X X a . . . h a b h
h
H L L X X QAQBQHQ
H
H L H X H QAQGQ
G
H L L X L QAQGQ
G
H H X X X QAQBQHQ
H
1
2
3
4
5
7
6
16
15
14
13
12
10
11
SH/LD
CLK
E
F
G
H
Q
H
V
DD
CLK INH
D
C
B
A
SER
8
9
V
SS
Q
H
1
2
3
4
5
7
6
16
15
14
13
12
10
11
V
DD
8 9
SH/LD
CLK
E
F
G
H
Q
H
CLK INH
D
C
B
A
SER
V
SS
Q
H
(1)
SH/LD
(15)
CLK INH
C2/
C1 (LOAD)
(10)
SER
(11)
A
SRG8
(9)
Q
H
(7)
Q
H
1
(2)
CLK
2D
1D
(12)
B
(13)
C
(14)
D
(3)
E
(4)
F
(5)
G
(6)
H
1D
1D
RadHard MSI Logic 114
UT54ACS165/UT54ACTS165
LOGIC DIAGRAM
RADIATION HARDNESS SPECIFICATIONS
1
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
PARAMETER LIMIT UNITS
Total Dose 1.0E6 rads(Si)
SEU Threshold
2
80
MeV-cm2/mg
SEL Threshold 120
MeV-cm2/mg
Neutron Fluence 1.0E14
n/cm
2
A B C D E F G
H
(11) (12) (13) (14) (4) (5) (6)
(3)
S
C
D
R
(1)
(15)
(2)
(10)
CLK INH
CLK
SER
Q
C
Q
D
Q
E
Q
F
Q
G
SH/LD
(9)
(7)
Q
H
Q
H
S
C
D
R
S
C
D
R
S
C
D
R
S
C
D
R
S
C
D
R
S
C
D
R
Q
A
S
C
D
R
Q
H
Q
B