XICOR X22C10DM, X22C10DI, X22C10D, X22C10SMB, X22C10SM Datasheet

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XICOR X22C10DM, X22C10DI, X22C10D, X22C10SMB, X22C10SM Datasheet

X22C10

256 Bit

X22C10

64 x 4

Nonvolatile Static RAM

FEATURES

High Performance CMOS —120ns RAM Access Time

High Reliability

—Store Cycles: 1,000,000 —Data Retention: 100 Years

Low Power Consumption

—Active: 40mA Max. —Standby: 100 μA Max.

Infinite Array Recall, RAM Read and Write Cycles

Nonvolatile Store Inhibit: VCC = 3.5V Typical

Fully TTL and CMOS Compatible

JEDEC Standard 18-Pin 300-mil DIP

100% Compatible with X2210 —With Timing Enhancements

DESCRIPTION

The X22C10 is a 64 x 4 CMOS NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile E2PROM. The NOVRAM design allows data to be easily transferred from RAM to E2PROM (STORE) and from E2PROM to RAM (RECALL). The STORE operation is completed within 5ms or less and the RECALL is completed within 1μs.

Xicor NOVRAMs are designed for unlimited write operations to the RAM, either RECALLs from E2PROM or writes from the host. The X22C10 will reliably endure 1,000,000 STORE cycles. Inherent data retention is greater than 100 years.

FUNCTIONAL DIAGRAM

 

 

 

 

 

PIN CONFIGURATION

 

 

 

 

 

 

 

 

 

PLASTIC DIP

 

 

NONVOLATILE E2PROM

 

 

 

 

 

 

 

CERDIP

 

 

 

 

 

 

 

 

 

 

 

 

MEMORY ARRAY

 

 

 

 

 

NC

1

18

VCC

 

 

 

 

 

STORE

A4

2

17

NC

 

 

 

 

 

A3

3

16

A5

A0

 

 

 

 

ARRAY

ROW

STATIC RAM

A2

4

15

I/O4

A1

RECALL

A1

5

X22C10 14

I/O3

SELECT

MEMORY ARRAY

 

 

A2

 

 

 

 

 

 

A0

6

13

I/O2

 

 

 

 

 

 

 

CS

7

12

I/01

STORE

CONTROL

 

 

 

VCC

VSS

8

11

WE

 

 

 

V

SS

STORE

9

10

RECALL

RECALL

LOGIC

COLUMN

 

 

 

 

 

I/O1

 

I/O CIRCUITS

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 FHD F02

 

 

 

 

 

 

 

 

 

 

I/O2

INPUT

COLUMN SELECT

 

 

 

 

 

 

 

 

 

 

 

 

 

SOIC

 

 

DATA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

I/O3

CONTROL

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

A4

1

16

VCC

 

 

A3

A4

A5

 

 

I/O4

 

 

 

A3

2

15

A5

 

 

 

 

 

 

 

A2

3

14

I/O4

 

 

 

 

 

 

 

A1

4

13

I/O3

 

 

 

 

 

 

 

 

 

X22C10

 

CS

 

 

 

 

 

 

A0

5

12

I/O2

 

 

 

 

 

 

CS

6

11

I/O1

 

 

 

 

 

 

 

WE

 

 

 

 

 

 

VSS

7

10

WE

 

 

 

 

 

 

STORE

8

9

RECALL

 

 

 

 

 

3815 FHD F01

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 FHD F08.1

© Xicor, Inc. 1991,1995 Patents Pending

1

Characteristics subject to change without notice

3815-2.4 7/26/96 T0/CO/D3 SH

 

 

 

X22C10

PIN DESCRIPTIONS AND DEVICE OPERATION

Addresses (A –A)

0 5

The address inputs select a 4-bit memory location during a read or write operation.

Chip Select (CS)

The Chip Select input must be LOW to enable read or write operations with the RAM array. CS HIGH will place the I/O pins in the high impedance state.

Write Enable (WE)

The Write Enable input controls the I/O buffers, determining whether a RAM read or write operation is enabled. When CS is LOW and WE is HIGH, the I/O pins will output data from the selected RAM address locations. When both CS and WE are LOW, data presented at the I/O pins will be written to the selected address location.

Data In/Data Out (I/O –I/O)

1 4

Data is written to or read from the X22C10 through the I/O pins. The I/O pins are placed in the high impedance state when either CS is HIGH or during either a store or recall operation.

STORE

The STORE input, when LOW, will initiate the transfer of the entire contents of the RAM array to the E2PROM array. The WE and RECALL inputs are inhibited during the store cycle. The store operation is completed in 5ms or less.

A store operation has priority over RAM read/write operations. If STORE is asserted during a read operation, the read will be discontinued. If STORE is asserted during a RAM write operation, the write will be immediately terminated and the store performed. The data at the RAM address that was being written will be unknown in both the RAM and E2PROM arrays.

RECALL

The RECALL input, when LOW, will initiate the transfer of the entire contents of the E2PROM array to the RAM array. The transfer of data will be completed in 1μs or less.

An array recall has priority over RAM read/write operations and will terminate both operations when RECALL is asserted. RECALL LOW will also inhibit the STORE

input.

Automatic Recall

Upon power-up the X22C10 will automatically recall data from the E2PROM array into the RAM array.

Write Protection

The X22C10 has three write protect features that are employed to protect the contents of the nonvolatile memory.

VCC Sense—All functions are inhibited when VCC is <3.5V typical.

Write Inhibit—Holding either STORE HIGH or RECALL LOW during power-up or power-down will prevent an inadvertent store operation and E2PROM data integrity will be maintained.

Noise Protection—A STORE pulse of typically less than 20ns will not initiate a store cycle.

PIN NAMES

Symbol

Description

 

 

A0–A5

Address Inputs

I/O1–I/O4

Data Inputs/Outputs

WE

Write Enable

 

 

CS

Chip Select

 

 

RECALL

Recall

 

 

STORE

Store

 

 

VCC

+5V

VSS

Ground

NC

No Connect

3815 PGM T01

2

X22C10

ABSOLUTE MAXIMUM RATINGS

–65°C to +135°C

Temperature under Bias

..................

Storage Temperature .......................

 

–65°C to +150°C

Voltage on any Pin with

 

 

Respect to VSS .......................................

 

–1V to +7V

D.C. Output Current ............................................

 

5mA

Lead Temperature

 

300°C

(Soldering, 10 seconds) ..............................

RECOMMENDED OPERATING CONDITIONS

 

 

 

 

Temperature

 

Min.

Max.

 

 

 

 

Commercial

 

0°C

+70°C

Industrial

 

–40°C

+85°C

 

 

 

 

Military

 

–55°C

+125°C

 

 

 

 

3815 PGM T12.1

COMMENT

Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Supply Voltage

Limits

 

 

X22C10

5V ±10%

 

 

 

3815 PGM T13

D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)

 

 

 

Limits

 

 

 

 

 

 

 

 

 

Symbol

Parameter

Min.

 

Max.

Units

Test Conditions

 

 

 

 

 

 

 

lCC

VCC Supply Current,

 

 

40

mA

CS = VIL, I/Os = Open, All Others =

 

RAM Read/Write

 

 

 

 

VIH, Addresses = 0.4V/2.4V Levels @

 

 

 

 

 

 

f = 8MHz

ISB1

VCC Standby Current

 

 

2

mA

Store or Recall Functions Not Active,

 

(TTL Inputs)

 

 

 

 

I/Os = Open, All Other Inputs = VIH

ISB2

VCC Standby Current

 

 

100

μA

Store or Recall functions Not Active,

 

(CMOS Inputs)

 

 

 

 

I/Os = Open, All Other Inputs =

 

 

 

 

 

 

VCC –0.3V

ILI

Input Leakage Current

 

 

10

μA

VIN = VSS to VCC

ILO

Output Leakage Current

 

 

10

μA

VOUT = VSS to VCC

VlL(2)

Input LOW Voltage

–1

 

0.8

V

 

VIH(2)

Input HIGH Voltage

2

 

VCC + 1

V

 

VOL

Output LOW Voltage

 

 

0.4

V

IOL = 4.2mA

VOH

Output HIGH Voltage

2.4

 

 

V

IOH = –2mA

 

 

 

 

 

 

3815 PGM T02.3

CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V

 

 

 

 

 

 

 

 

Symbol

Parameter

Max.

Units

Test Conditions

 

 

 

 

 

CI/O(1)

Input/Output Capacitance

8

pF

VI/O = 0V

C

(1)

Input Capacitance

6

pF

V = 0V

 

IN

 

 

 

 

IN

 

 

 

 

 

 

3815 PGM T03

Notes:

(1)

This parameter is periodically sampled and not 100% tested.

 

 

 

 

(2)

VIL min. and VIH max. are for reference only and are not tested.

 

 

 

3

X22C10

MODE SELECTION

CE

WE

RECALL

STORE

I/O

Mode

 

 

 

 

 

 

H

X

H

H

Output High Z

Not Selected(3)

L

H

H

H

Output Data

Read RAM

 

 

 

 

 

 

L

L

H

H

Input Data HIGH

Write “1” RAM

 

 

 

 

 

 

L

L

H

H

Input Data LOW

Write “0” RAM

X

H

L

H

Output High Z

Array Recall

 

 

 

 

 

 

H

X

L

H

Output High Z

Array Recall

 

 

 

 

 

 

X

H

H

L

Output High Z

Nonvolatile Store(4)

H

X

H

L

Output High Z

Nonvolatile Store(4)

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 PGM T05.1

ENDURANCE AND DATA RETENTION

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

 

Min.

 

 

 

 

 

Units

 

 

 

 

 

 

 

 

 

 

 

 

 

Endurance

 

 

100,000

 

 

 

Data Changes Per Bit

 

 

 

 

 

 

 

 

 

 

 

 

 

Store Cycles

 

 

1,000,000

 

 

 

 

Store Cycles

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Retention

 

 

100

 

 

 

 

 

 

Years

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 PGM T06

POWER-UP TIMING

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

 

 

Parameter

 

 

 

 

 

Max.

 

 

Units

 

 

 

 

 

 

 

 

 

 

 

 

 

tPUR(5)

 

Power-up to Read Operation

 

 

 

 

100

 

 

μs

tPUW(5)

 

Power-up to Write or Store Operation

 

5

 

 

ms

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 PGM T07

EQUIVALENT A.C. LOAD CIRCUIT

 

 

A.C. CONDITIONS OF TEST

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5V

 

 

 

 

 

Input Pulse Levels

 

 

0V to 3V

 

 

 

 

 

 

 

Input Rise and

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Fall Times

 

 

10ns

 

 

919Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input and Output

 

 

 

 

 

 

 

 

 

 

 

Timing Levels

 

 

1.5V

OUTPUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3815 PGM T04.1

 

 

497Ω

 

100pF

 

 

 

 

 

 

 

 

 

3815 FHD F09.1

Notes: (3) Chip is deselected but may be automatically completing a store cycle.

(4)STORE = LOW is required only to initiate the store cycle, after which the store cycle will be automatically completed

(e.g. STORE = X).

(5)tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. These parameters are periodically sampled and not 100% tested.

4

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