X22C10
256 Bit |
X22C10 |
64 x 4 |
Nonvolatile Static RAM
FEATURES
•High Performance CMOS —120ns RAM Access Time
•High Reliability
—Store Cycles: 1,000,000 —Data Retention: 100 Years
•Low Power Consumption
—Active: 40mA Max. —Standby: 100 μA Max.
•Infinite Array Recall, RAM Read and Write Cycles
•Nonvolatile Store Inhibit: VCC = 3.5V Typical
•Fully TTL and CMOS Compatible
•JEDEC Standard 18-Pin 300-mil DIP
•100% Compatible with X2210 —With Timing Enhancements
DESCRIPTION
The X22C10 is a 64 x 4 CMOS NOVRAM featuring a high-speed static RAM overlaid bit-for-bit with a nonvolatile E2PROM. The NOVRAM design allows data to be easily transferred from RAM to E2PROM (STORE) and from E2PROM to RAM (RECALL). The STORE operation is completed within 5ms or less and the RECALL is completed within 1μs.
Xicor NOVRAMs are designed for unlimited write operations to the RAM, either RECALLs from E2PROM or writes from the host. The X22C10 will reliably endure 1,000,000 STORE cycles. Inherent data retention is greater than 100 years.
FUNCTIONAL DIAGRAM |
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PIN CONFIGURATION |
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PLASTIC DIP |
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NONVOLATILE E2PROM |
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CERDIP |
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MEMORY ARRAY |
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NC |
1 |
18 |
VCC |
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STORE |
A4 |
2 |
17 |
NC |
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A3 |
3 |
16 |
A5 |
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A0 |
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ARRAY |
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ROW |
STATIC RAM |
A2 |
4 |
15 |
I/O4 |
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A1 |
RECALL |
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A1 |
5 |
X22C10 14 |
I/O3 |
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SELECT |
MEMORY ARRAY |
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A2 |
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A0 |
6 |
13 |
I/O2 |
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CS |
7 |
12 |
I/01 |
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STORE |
CONTROL |
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VCC |
VSS |
8 |
11 |
WE |
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V |
SS |
STORE |
9 |
10 |
RECALL |
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RECALL |
LOGIC |
COLUMN |
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I/O1 |
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I/O CIRCUITS |
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3815 FHD F02 |
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I/O2 |
INPUT |
COLUMN SELECT |
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SOIC |
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DATA |
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I/O3 |
CONTROL |
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A4 |
1 |
16 |
VCC |
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A3 |
A4 |
A5 |
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I/O4 |
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A3 |
2 |
15 |
A5 |
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A2 |
3 |
14 |
I/O4 |
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A1 |
4 |
13 |
I/O3 |
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X22C10 |
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CS |
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A0 |
5 |
12 |
I/O2 |
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CS |
6 |
11 |
I/O1 |
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WE |
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VSS |
7 |
10 |
WE |
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STORE |
8 |
9 |
RECALL |
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3815 FHD F01 |
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3815 FHD F08.1 |
© Xicor, Inc. 1991,1995 Patents Pending |
1 |
Characteristics subject to change without notice |
3815-2.4 7/26/96 T0/CO/D3 SH |
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X22C10
PIN DESCRIPTIONS AND DEVICE OPERATION
Addresses (A –A)
0 5
The address inputs select a 4-bit memory location during a read or write operation.
Chip Select (CS)
The Chip Select input must be LOW to enable read or write operations with the RAM array. CS HIGH will place the I/O pins in the high impedance state.
Write Enable (WE)
The Write Enable input controls the I/O buffers, determining whether a RAM read or write operation is enabled. When CS is LOW and WE is HIGH, the I/O pins will output data from the selected RAM address locations. When both CS and WE are LOW, data presented at the I/O pins will be written to the selected address location.
Data In/Data Out (I/O –I/O)
1 4
Data is written to or read from the X22C10 through the I/O pins. The I/O pins are placed in the high impedance state when either CS is HIGH or during either a store or recall operation.
STORE
The STORE input, when LOW, will initiate the transfer of the entire contents of the RAM array to the E2PROM array. The WE and RECALL inputs are inhibited during the store cycle. The store operation is completed in 5ms or less.
A store operation has priority over RAM read/write operations. If STORE is asserted during a read operation, the read will be discontinued. If STORE is asserted during a RAM write operation, the write will be immediately terminated and the store performed. The data at the RAM address that was being written will be unknown in both the RAM and E2PROM arrays.
RECALL
The RECALL input, when LOW, will initiate the transfer of the entire contents of the E2PROM array to the RAM array. The transfer of data will be completed in 1μs or less.
An array recall has priority over RAM read/write operations and will terminate both operations when RECALL is asserted. RECALL LOW will also inhibit the STORE
input.
Automatic Recall
Upon power-up the X22C10 will automatically recall data from the E2PROM array into the RAM array.
Write Protection
The X22C10 has three write protect features that are employed to protect the contents of the nonvolatile memory.
•VCC Sense—All functions are inhibited when VCC is <3.5V typical.
•Write Inhibit—Holding either STORE HIGH or RECALL LOW during power-up or power-down will prevent an inadvertent store operation and E2PROM data integrity will be maintained.
•Noise Protection—A STORE pulse of typically less than 20ns will not initiate a store cycle.
PIN NAMES
Symbol |
Description |
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A0–A5 |
Address Inputs |
I/O1–I/O4 |
Data Inputs/Outputs |
WE |
Write Enable |
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CS |
Chip Select |
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RECALL |
Recall |
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STORE |
Store |
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VCC |
+5V |
VSS |
Ground |
NC |
No Connect |
3815 PGM T01
2
X22C10
ABSOLUTE MAXIMUM RATINGS |
–65°C to +135°C |
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Temperature under Bias |
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Storage Temperature ....................... |
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–65°C to +150°C |
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Voltage on any Pin with |
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Respect to VSS ....................................... |
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–1V to +7V |
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D.C. Output Current ............................................ |
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5mA |
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Lead Temperature |
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300°C |
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(Soldering, 10 seconds) .............................. |
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RECOMMENDED OPERATING CONDITIONS |
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Temperature |
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Min. |
Max. |
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Commercial |
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0°C |
+70°C |
Industrial |
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–40°C |
+85°C |
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Military |
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–55°C |
+125°C |
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3815 PGM T12.1
COMMENT
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Supply Voltage |
Limits |
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X22C10 |
5V ±10% |
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3815 PGM T13 |
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)
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Limits |
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Symbol |
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Min. |
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Max. |
Units |
Test Conditions |
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lCC |
VCC Supply Current, |
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40 |
mA |
CS = VIL, I/Os = Open, All Others = |
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RAM Read/Write |
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VIH, Addresses = 0.4V/2.4V Levels @ |
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f = 8MHz |
ISB1 |
VCC Standby Current |
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2 |
mA |
Store or Recall Functions Not Active, |
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(TTL Inputs) |
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I/Os = Open, All Other Inputs = VIH |
ISB2 |
VCC Standby Current |
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100 |
μA |
Store or Recall functions Not Active, |
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(CMOS Inputs) |
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I/Os = Open, All Other Inputs = |
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VCC –0.3V |
ILI |
Input Leakage Current |
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10 |
μA |
VIN = VSS to VCC |
ILO |
Output Leakage Current |
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10 |
μA |
VOUT = VSS to VCC |
VlL(2) |
Input LOW Voltage |
–1 |
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0.8 |
V |
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VIH(2) |
Input HIGH Voltage |
2 |
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VCC + 1 |
V |
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VOL |
Output LOW Voltage |
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0.4 |
V |
IOL = 4.2mA |
VOH |
Output HIGH Voltage |
2.4 |
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V |
IOH = –2mA |
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3815 PGM T02.3 |
CAPACITANCE TA = +25°C, f = 1MHz, VCC = 5V |
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Symbol |
Parameter |
Max. |
Units |
Test Conditions |
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CI/O(1) |
Input/Output Capacitance |
8 |
pF |
VI/O = 0V |
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C |
(1) |
Input Capacitance |
6 |
pF |
V = 0V |
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IN |
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IN |
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3815 PGM T03 |
Notes: |
(1) |
This parameter is periodically sampled and not 100% tested. |
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(2) |
VIL min. and VIH max. are for reference only and are not tested. |
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3
X22C10
MODE SELECTION
CE |
WE |
RECALL |
STORE |
I/O |
Mode |
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H |
X |
H |
H |
Output High Z |
Not Selected(3) |
L |
H |
H |
H |
Output Data |
Read RAM |
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L |
L |
H |
H |
Input Data HIGH |
Write “1” RAM |
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L |
L |
H |
H |
Input Data LOW |
Write “0” RAM |
X |
H |
L |
H |
Output High Z |
Array Recall |
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H |
X |
L |
H |
Output High Z |
Array Recall |
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X |
H |
H |
L |
Output High Z |
Nonvolatile Store(4) |
H |
X |
H |
L |
Output High Z |
Nonvolatile Store(4) |
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3815 PGM T05.1 |
ENDURANCE AND DATA RETENTION |
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Parameter |
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Min. |
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Units |
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Endurance |
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100,000 |
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Data Changes Per Bit |
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Store Cycles |
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1,000,000 |
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Store Cycles |
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Data Retention |
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100 |
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Years |
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3815 PGM T06 |
POWER-UP TIMING |
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Symbol |
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Parameter |
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Max. |
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Units |
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tPUR(5) |
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Power-up to Read Operation |
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100 |
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μs |
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tPUW(5) |
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Power-up to Write or Store Operation |
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5 |
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ms |
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3815 PGM T07 |
EQUIVALENT A.C. LOAD CIRCUIT |
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A.C. CONDITIONS OF TEST |
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5V |
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Input Pulse Levels |
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0V to 3V |
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Input Rise and |
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Fall Times |
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10ns |
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919Ω |
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Input and Output |
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Timing Levels |
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1.5V |
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OUTPUT |
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3815 PGM T04.1 |
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497Ω |
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100pF |
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3815 FHD F09.1
Notes: (3) Chip is deselected but may be automatically completing a store cycle.
(4)STORE = LOW is required only to initiate the store cycle, after which the store cycle will be automatically completed
(e.g. STORE = X).
(5)tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. These parameters are periodically sampled and not 100% tested.
4