XICOR X20C04P, X20C04JM-25, X20C04JM-20, X20C04JM-15, X20C04JM Datasheet

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XICOR X20C04P, X20C04JM-25, X20C04JM-20, X20C04JM-15, X20C04JM Datasheet

X20C04

4K

X20C04

512 x 8 Bit

Nonvolatile Static RAM

FEATURES

High Reliability

Endurance: 1,000,000 Nonvolatile Store Operations

Retention: 100 Years Minimum

Power-on Recall

E 2PROM Data Automatically Recalled Into SRAM Upon Power-up

Lock Out Inadvertent Store Operations

Low Power CMOS

Standby: 250 μA

Infinite E2PROM Array Recall, and RAM Read and Write Cycles

Compatible with X2004

PIN CONFIGURATION

PLASTIC

CERDIP

NE

1

28

VCC

NC

2

27

WE

 

A7

3

26

NC

A6

4

25

A8

A5

5

24

NC

A4

6

23

NC

 

A3

7

22

OE

A2

8

X20C04 21

NC

 

A1

9

20

CE

A0

10

19

I/O7

I/O0

11

18

I/O6

I/O1

12

17

I/O5

I/O2

13

16

I/O4

VSS

14

15

I/O3

DESCRIPTION

The Xicor X20C04 is a 512 x 8 NOVRAM featuring a static RAM overlaid bit-for-bit with a nonvolatile electrically erasable PROM (E2PROM). The X20C04 is fabricated with advanced CMOS floating gate technology to achieve low power and wide power-supply margin. The X20C04 features the JEDEC approved pinout for bytewide memories, compatible with industry standard RAMs, ROMs, EPROMs, and E2PROMs.

The NOVRAM design allows data to be easily transferred from RAM to E2PROM (store) and E2PROM to RAM (recall). The store operation is completed in 5ms or less and the recall operation is completed in 5μs or less.

Xicor NOVRAMS are designed for unlimited write operations to RAM, either from the host or recalls from E2PROM, and a minimum 1,000,000 store operations to the E2PROM. Data retention is specified to be greater than 100 years.

LCC

PLCC

 

7

NC

 

NE

NC

CC

 

WE

NC

 

 

 

 

 

 

 

 

 

 

A

 

V

 

 

 

 

 

4

3

2

1

32

31

30

 

 

 

A6

 

 

 

 

 

 

 

 

 

 

A8

5

 

 

 

 

 

 

 

29

 

A5

6

 

 

 

 

 

 

 

28

 

NC

A4

7

 

 

 

 

 

 

 

27

 

NC

A3

8

 

 

X20C04

 

 

26

 

NC

 

9

 

 

 

 

25

 

 

 

A2

 

 

 

 

OE

(TOP VIEW)

 

 

 

A1

10

 

 

 

 

 

 

 

24

 

NC

A0

11

 

 

 

 

 

 

 

23

 

CE

 

NC

12

 

 

 

 

 

 

 

22

 

I/O7

I/O0

13

15

16

17

18

19

21

 

I/O6

 

14

20

 

 

 

 

1

2

 

SS

NC

3

4

5

 

 

 

 

I/O

I/O

 

V

I/O

 

I/O

I/O

 

 

 

3825 FHD F02

3825 FHD F03

©Xicor, Inc. 1992, 1995, 1996 Patents Pending

1

Characteristics subject to change without notice

3825-2.8 7/31/97 T4/C0/D0 SH

 

X20C04

PIN DESCRIPTIONS

Addresses (A –A)

0 8

The Address inputs select an 8-bit memory location during a read or write operation.

Chip Enable (CE)

The Chip Enable input must be LOW to enable all read/ write operations. When CE is HIGH, power consumption is reduced.

Output Enable (OE)

The Output Enable input controls the data output buffers and is used to initiate read and recall operations. Output Enable LOW disables a store operation regardless of the state of CE, WE, or NE.

Data In/Data Out (I/O –I/O)

0 7

Data is written to or read from the X20C04 through the I/O pins. The I/O pins are placed in the high impedance state when either CE or OE is HIGH or when NE is LOW.

FUNCTIONAL DIAGRAM

A3–A6

 

 

ROW

 

 

SELECT

CE

 

 

 

 

 

 

OE

CONTROL

 

 

 

 

 

 

WE

LOGIC

 

 

 

 

NE

 

 

 

A0–A2

 

 

 

 

 

 

A7–A8

 

 

 

Write Enable (WE)

The Write Enable input controls the writing of data to both the static RAM and stores to the E2PROM.

Nonvolatile Enable (NE)

The Nonvolatile Enable input controls all accesses to the E2PROM array (store and recall functions).

PIN NAMES

Symbol

Description

 

 

A0–A8

Address Inputs

I/O0–I/O7

Data Input/Output

WE

Write Enable

 

 

CE

Chip Enable

OE

Output Enable

 

 

NE

Nonvolatile Enable

 

 

VCC

+5V

VSS

Ground

NC

No Connect

 

 

3825 PGM T01

VCC SENSE

EEPROM ARRAY

512 x 8

RECALL

SRAM

 

ARRAY

STORE

 

COLUMN SELECT

&

I/OS

I/O0–I/O7

3825 FHD F01

 

2

X20C04

DEVICE OPERATION

The CE, OE, WE and NE inputs control the X20C04 operation. The X20C04 byte-wide NOVRAM uses a 2-line control architecture to eliminate bus contention in a system environment. The I/O bus will be in a high impedance state when either OE or CE is HIGH, or when NE is LOW.

RAM Operations

RAM read and write operations are performed as they would be with any static RAM. A read operation requires CE and OE to be LOW with WE and NE HIGH. A write operation requires CE and WE to be LOW with NE HIGH. There is no limit to the number of read or write operations performed to the RAM portion of the X20C04.

Nonvolatile Operations

With NE LOW, recall operation is performed in the same manner as RAM read operation. A recall operation causes the entire contents of the E2PROM to be written into the RAM array. The time required for the operation to complete is 5μs or less. A store operation causes the entire contents of the RAM array to be stored in the nonvolatile E2PROM. The time for the operation to complete is 5ms or less.

Power-Up Recall

Upon power-up (VCC), the X20C04 performs an automatic array recall. When VCC minimum is reached, the

recall is initiated, regardless of the state of CE, OE, WE and NE.

Write Protection

The X20C04 has five write protect features that are employed to protect the contents of both the nonvolatile memory and the RAM.

VCC Sense—All functions are inhibited when VCC is 3.5V.

A RAM write is required before a Store Cycle is initiated.

Write Inhibit—Holding either OE LOW, WE HIGH, CE HIGH, or NE HIGH during power-up and powerdown will prevent an inadvertent store operation.

Noise Protection—A combined WE, NE, OE and CE pulse of less than 20ns will not initiate a Store Cycle.

Noise Protection—A combined WE, NE, OE and CE pulse of less than 20ns will not initiate a recall cycle.

SYMBOL TABLE

WAVEFORM INPUTS

OUTPUTS

 

 

 

 

 

 

 

 

Must be

Will be

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

steady

steady

 

 

 

 

 

 

 

 

May change

Will change

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

from LOW

from LOW

 

 

 

 

 

 

 

 

to HIGH

to HIGH

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

May change

Will change

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

from HIGH

from HIGH

 

 

 

 

 

 

 

 

to LOW

to LOW

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Don’t Care:

Changing:

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Changes

State Not

 

 

 

 

 

 

 

 

Allowed

Known

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

N/A

Center Line

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

is High

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Impedance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3

X20C04

ABSOLUTE MAXIMUM RATINGS*

–65°C to +135°C

Temperature under Bias ..................

Storage Temperature .......................

–65°C to +150°C

Voltage on any Pin with

 

Respect to VSS .......................................

–1V to +7V

D.C. Output Current ...........................................

10mA

Lead Temperature (Soldering, 10 seconds) ..... 300°C

RECOMMENDED OPERATING CONDITIONS

Temperature

Min.

Max.

 

 

 

Commercial

0°C

+70°C

 

 

 

Industrial

–40°C

+85°C

 

 

 

Military

–55°C

+125°C

 

 

 

3825 PGM T02.1

*COMMENT

Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and the functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

Supply Voltage

Limits

 

 

X20C04

5V ±10%

 

 

3825 PGM T03

D.C. OPERATING CHARACTERISTICS (Over recommended operating conditions unless otherwise specified.)

 

 

 

Limits

 

 

 

 

 

 

 

 

Symbol

Parameter

Min.

Max.

Units

Test Conditions

 

 

 

 

 

 

lCC1

VCC Current (Active)

 

100

mA

NE = WE = VIH, CE = OE = VIL

 

 

 

 

 

Address Inputs = 0.4V/2.4V levels

 

 

 

 

 

@ f = 5MHz. All I/Os = Open

 

 

 

 

 

 

ICC2

VCC Current During Store

 

10

mA

All Inputs = VIH

 

 

 

 

 

All I/Os = Open

ISB1

VCC Standby Current

 

10

mA

CE = VIH

 

(TTL Input)

 

 

 

All Other Inputs = VIH, All I/Os = Open

ISB2

VCC Standby Current

 

250

μA

All Inputs = VCC – 0.3V

 

(CMOS Input)

 

 

 

All I/Os = Open

ILI

Input Leakage Current

 

10

μA

VIN = VSS to VCC

ILO

Output Leakage Current

 

10

μA

VOUT = VSS to VCC, CE = VIH

VIL(1)

Input LOW Voltage

–1

0.8

V

 

V (1)

Input HIGH Voltage

2

V + 0.5

V

 

IH

 

 

CC

 

 

VOL

Output LOW Voltage

 

0.4

V

IOL = 2.1mA

VOH

Output HIGH Voltage

2.4

 

V

IOH = –400μA

 

 

 

 

 

 

 

 

 

3825 PGM T04.3

POWER-UP TIMING

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

 

Parameter

 

 

Max.

Units

 

 

 

 

 

 

 

 

 

 

tPUR(2)

 

Power-Up to RAM Operation

 

 

100

 

μs

tPUW(2)

 

Power-Up to Nonvolatile Operation

 

 

5

 

ms

 

 

 

 

 

 

 

 

 

3825 PGM T05

CAPACITANCE TA = +25°C, F = 1MHz, VCC = 5V.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Symbol

 

Test

 

Max.

 

Units

 

Conditions

 

 

 

 

 

 

 

 

 

CI/O(2)

 

Input/Output Capacitance

 

10

 

pF

 

VI/O = 0V

C (2)

 

Input Capacitance

 

6

 

pF

 

V = 0V

IN

 

 

 

 

 

 

 

IN

3825 PGM T06.1

Notes: (1) VIL min. and VIH max. are for reference only and are not tested.

(2) This parameter is periodically sampled and not 100% tested.

4

X20C04

ENDURANCE AND DATA RETENTION

 

Parameter

 

 

 

 

Min.

 

 

 

Units

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Endurance

 

 

 

100,000

 

Data Changes Per Bit

 

Store Cycles

 

 

 

1,000,000

 

 

 

Store Cycles

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Retention

100

 

 

 

 

Years

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3825 PGM T07.1

MODE SELECTION

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CE

WE

NE

 

OE

 

Mode

 

I/O

 

Power

 

 

 

 

 

 

 

 

 

 

H

X

X

 

X

 

Not Selected

Output High Z

 

Standby

 

 

 

 

 

 

 

 

 

 

L

H

H

 

L

 

Read RAM

Output Data

 

Active

L

L

H

 

H

 

Write “1” RAM

Input Data High

 

Active

 

 

 

 

 

 

 

 

 

 

L

L

H

 

H

 

Write “0” RAM

Input Data Low

 

Active

 

 

 

 

 

 

 

 

 

 

L

H

L

 

L

 

Array Recall

Output High Z

 

Active

L

L

L

 

H

 

Nonvolatile Storing

Output High Z

 

Active

 

 

 

 

 

 

 

 

 

 

L

H

H

 

H

 

Output Disabled

Output High Z

 

Active

 

 

 

 

 

 

 

 

 

 

L

L

L

 

L

 

Not Allowed

Output High Z

 

Active

L

H

L

 

H

 

No Operation

Output High Z

 

Active

 

 

 

 

 

 

 

 

 

 

 

 

 

3825 PGM T09.1

EQUIVALENT A.C. LOAD CIRCUIT

 

 

A.C. CONDITIONS OF TEST

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5V

 

 

 

 

 

 

Input Pulse Levels

 

 

0V to 3V

 

 

 

 

 

 

 

 

Input Rise and

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1.92KΩ

 

 

 

Fall Times

 

 

10ns

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input and Output

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Timing Levels

 

 

1.5V

 

OUTPUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3825 PGM T08.2

 

 

 

1.37KΩ

100pF

 

 

 

 

 

 

 

 

 

 

 

 

 

3825 FHD F04.1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5

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