Leica CLEANLINESS EXPERT Manual

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Leica Cleanliness Expert
The new analysis software for measurement and
classification of particles on filters.
Living up to Life
Critical Quality Factors
The lifetime and functionality of engineering
components often depend on the cleanliness
of their surface after the production process
and durability. Leica Cleanliness Expert is a
helps monitor the quality of components
during the manufacturing process.
Reliability by experience
being miniturised, cleanliness monitoring
systems and analysing software need to be
adapted and improved. Over the last 10 years,
Leica Microsystems has been developing its
systems in close collaboration with leading
representatives of the automotive industry to
ensure that we meet our customers growing
needs.
Leica Cleanliness Expert
Leica Cleanliness Expert is designed to
measure the contamination of cleaning fluids
can be used in all applications where particle
shaped substrates is undertaken. During the
measurement process an overview image of
the whole filter is built up and the length of the
largest detected feature is displayed. The user
preparation, imaging quality and the presence
of very large fibres and particles.
The Expert for Quality Assurance
Featur e Highlights:
Easy to use and quick to perform meas-
urements on circular filters for rapid
results
Automatic differentiation between
reflective and non-reflective features
to trace back the source or potential
risk of contamination.
Measurement parameters and system
settings are automatically stored and
can be recalled for reproducible and
consistent measurement conditions.
Rapid measurement and classification
of different particles simultaneously to
increase throughput.
Editing function with documentation for
easy and reliable control of the results
Live particle information to obtain early
feedback on the severest contamina-
tion to decrease response time.
Limitless feature length detection func-
tion for the accurate measurement of
large and small particles at the same
magnification.
Access to measured particle data
for artefact removal and further data
processing
Fully compliant with the latest stand-
ards (ISO 16232 and VDA 19) imple-
mented in cleanliness detection.
User management to avoid unauthor-
ised alterations of settings.
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