2.4-GHz Bluetooth™ low energy and Proprietary System-on-Chip
Check for Samples: CC2541
1
FEATURES
23
•RF– High-Performance and Low-Power 8051
– 2.4-GHz Bluetooth low energy Compliant
and Proprietary RF System-on-Chip– In-System-Programmable Flash, 128- or
– Supports 250-kbps, 500-kbps, 1-Mbps, 2-
Mbps Data Rates– 8-KB RAM With Retention in All Power
– Excellent Link Budget, Enabling Long-
Range Applications Without External Front– Hardware Debug Support
End
– Programmable Output Power up to 0 dBmAuto-Acknowledgment and Address
– Excellent Receiver Sensitivity (–94 dBm at
1 Mbps), Selectivity, and Blocking– Retention of All Relevant Registers in All
PerformancePower Modes
– Suitable for Systems Targeting Compliance•Peripherals
With Worldwide Radio Frequency
Regulations: ETSI EN 300 328 and EN 300
440 Class 2 (Europe), FCC CFR47 Part 15
(US), and ARIB STD-T66 (Japan)
•Layout
– Few External Components
– Reference Design Provided
– 6-mm × 6-mm QFN-40 Package
– Pin-Compatible With CC2540 (When Not
Using USB or I2C)
•Low Power
– Active-Mode RX Down to: 17.9 mA
– Active-Mode TX (0 dBm): 18.2 mA
– Power Mode 1 (4-µs Wake-Up): 270 µA
– Power Mode 2 (Sleep Timer On): 1 µA
– Power Mode 3 (External Interrupts): 0.5 µA
– Wide Supply-Voltage Range (2 V–3.6 V)
•TPS62730 Compatible Low Power in Active
Mode
– RX Down to: 14.7 mA (3-V supply)
– TX (0 dBm): 14.3 mA (3-V supply)
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•Microcontroller
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2Bluetooth is a trademark of Bluetooth SIG, Inc..
3ZigBee is a registered trademark of ZigBee Alliance.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Microcontroller Core With Code Prefetch
256-KB
Modes
– Extensive Baseband Automation, Including
Decoding
– Powerful Five-Channel DMA
– General-Purpose Timers (One 16-Bit, Two
8-Bit)
– IR Generation Circuitry
– 32-kHz Sleep Timer With Capture
– Accurate Digital RSSI Support
– Battery Monitor and Temperature Sensor
– 12-Bit ADC With Eight Channels and
Configurable Resolution
– AES Security Coprocessor
– Two Powerful USARTs With Support for
Several Serial Protocols
– 23 General-Purpose I/O Pins
•30-nA Bypass Mode Current to Support LowPower Modes
•RF Performance Unchanged
•Small Package Allows for Small Solution Size
•CC2541 Controllable
DESCRIPTION
The CC2541 is a power-optimized true system-onchip (SoC) solution for both Bluetooth low energy and
proprietary 2.4-GHz applications. It enables robust
network nodes to be built with low total bill-of-material
costs.TheCC2541combinestheexcellent
performance of a leading RF transceiver with an
industry-standard enhanced 8051 MCU, in-system
programmable flash memory, 8-KB RAM, and many
other powerful supporting features and peripherals.
The CC2541 is highly suited for systems where
ultralow power consumption is required. This is
specified by various operating modes. Short transition
times between operating modes further enable low
power consumption.
The CC2541 is pin-compatible with the CC2540 in
the 6-mm × 6-mm QFN40 package, if the USB is not
used on the CC2540 and the I2C/extra I/O is not used
on the CC2541. Compared to the CC2540, the
CC2541 provides lower RF current consumption. The
CC2541 does not have the USB interface of the
CC2540, and provides lower maximum output power
in TX mode. The CC2541 also adds a HW I2C
interface.
The CC2541 is pin-compatible with the CC2533
RF4CE-optimized IEEE 802.15.4 SoC.
The CC2541 comes in twodifferent versions:
CC2541F128/F256, with 128 KB and 256 KB of flash
memory, respectively.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
Supply voltageAll supply pins must have the same voltage–0.33.9V
Voltage on any digital pin–0.3VDD + 0.3 ≤ 3.9V
Input RF level10dBm
Storage temperature range–40125°C
All pins, excluding pins 25 and 26, according to human-body
model, JEDEC STD 22, method A114
(2)
ESD
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) CAUTION: ESD sesnsitive device. Precautions should be used when handling the device in order to prevent permanent damage.
All pins, according to human-body model, JEDEC STD 22,
method A114
According to charged-device model, JEDEC STD 22, method
C101
2kV
1kV
500V
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MINNOMMAXUNIT
Operating ambient temperature range, T
Operating supply voltage23.6V
A
–4085°C
ELECTRICAL CHARACTERISTICS
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V,
1 Mbps, GFSK, 250-kHz deviation, Bluetooth low energy mode, and 0.1% BER
PARAMETERTEST CONDITIONSMINTYP MAX UNIT
RX mode, standard mode, no peripherals active, low MCU
activity
RX mode, high-gain mode, no peripherals active, low MCU
activity
Peripheral current consumption
(Adds to core current I
peri
peripheral unit activated)
core
for each
Power mode 1. Digital regulator on; 16-MHz RCOSC and 32MHz crystal oscillator off; 32.768-kHz XOSC, POR, BOD and270
sleep timer active; RAM and register retention
Power mode 2. Digital regulator off; 16-MHz RCOSC and 32MHz crystal oscillator off; 32.768-kHz XOSC, POR, and sleep1
timer active; RAM and register retention
Power mode 3. Digital regulator off; no clocks; POR active;
RAM and register retention
Low MCU activity: 32-MHz XOSC running. No radio or
peripherals. Limited flash access, no RAM access.
Frequency error tolerance
Symbol rate errorMaximum packet length. Sensitivity better than –67 dBm, 250 byte
tolerance
(1) Difference between center frequency of the received RF signal and local oscillator frequency
(2) Difference between incoming symbol rate and the internally generated symbol rate
(2)
(2)
(1)
250 byte payload. BER 0.1%
payload. BER 0.1%
±2 MHz offset, 0.1% BER, wanted signal –67 dBm–1
±6 MHz or greater offset, 0.1% BER, wanted signal –67 dBm39
Including both initial tolerance and drift. Sensitivity better than –67 dBm,
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C, VDD = 3 V, fc= 2440 MHz
PARAMETERTEST CONDITIONSMINTYP MAXUNIT
1 Mbps, GFSK, 250-kHz Deviation, Bluetooth low energy Mode, 0.1% BER
Receiver sensitivity
Saturation
(4)
Co-channel rejection
(3)(4)
(4)
In-band blocking rejection
Out-of-band blocking
rejection
Intermodulation
(4)
(4)
Frequency error tolerance
Symbol rate errorMaximum packet length. Sensitivity better than –67 dBm, 250 byte
tolerance
(6)
1 Mbps, GFSK, 160-kHz Deviation, 0.1% BER
Receiver sensitivity
(7)
SaturationBER < 0.1%0dBm
Co-channel rejectionWanted signal 10 dB above sensitivity level–9dB
In-band blocking rejectiondB
Frequency error tolerance
Symbol rate errorMaximum packet length. Sensitivity better than –67 dBm, 250-byte
tolerance
(6)
500 kbps, MSK, 0.1% BER
Receiver sensitivity
(7)
SaturationBER < 0.1%0dBm
Co-channel rejectionWanted signal –67 dBm–5dB
In-band blocking rejection±2-MHz offset, 0.1% BER, wanted signal –67 dBm27dB
Frequency error tolerance–150150kHz
Symbol rate error tolerance–8080ppm
(3) The receiver sensitivity setting is programmable using a TI BLE stack vendor-specific API command. The default value is standard
mode.
(4) Results based on standard-gain mode.
(5) Difference between center frequency of the received RF signal and local oscillator frequency
(6) Difference between incoming symbol rate and the internally generated symbol rate
(7) Results based on high-gain mode.
High-gain mode–94
Standard mode–88
BER < 0.1%5dBm
Wanted signal –67 dBm–6dB
±1 MHz offset, 0.1% BER, wanted signal –67 dBm–2
±2 MHz offset, 0.1% BER, wanted signal –67 dBm26
(4)
±3 MHz offset, 0.1% BER, wanted signal –67 dBm34
>6 MHz offset, 0.1% BER, wanted signal –67 dBm33
Minimum interferer level < 2 GHz (Wanted signal –67 dBm)–21
Minimum interferer level [2 GHz, 3 GHz] (Wanted signal –67 dBm)–25dBm
Minimum interferer level > 3 GHz (Wanted signal –67 dBm)–7
Minimum interferer level–36dBm
Including both initial tolerance and drift. Sensitivity better than -67dBm,
(5)
250 byte payload. BER 0.1%
payload. BER 0.1%
–250250kHz
–8080ppm
–91dBm
±1-MHz offset, 0.1% BER, wanted signal –67 dBm2
±2-MHz offset, 0.1% BER, wanted signal –67 dBm24
±3-MHz offset, 0.1% BER, wanted signal -–67 dBm27
>6-MHz offset, 0.1% BER, wanted signal –67 dBm32
Including both initial tolerance and drift. Sensitivity better than –67 dBm,
(5)
250-byte payload. BER 0.1%
payload. BER 0.1%
–200200kHz
–8080ppm
–99dBm
±1-MHz offset, 0.1% BER, wanted signal –67 dBm20
>2-MHz offset, 0.1% BER, wanted signal –67 dBm28
Including both initial tolerance and drift. Sensitivity better than –67 dBm,
250-byte payload. BER 0.1%
Maximum packet length. Sensitivity better than –67 dBm, 250-byte
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C, VDD = 3 V, fc= 2440 MHz
PARAMETERTEST CONDITIONSMINTYP MAXUNIT
250 kbps, GFSK, 160 kHz Deviation, 0.1% BER
Receiver sensitivity
SaturationBER < 0.1%0dBm
Co-channel rejectionWanted signal -67 dBm–3dB
In-band blocking rejection±2-MHz offset, 0.1% BER, wanted signal –67 dBm28dB
Frequency error tolerance
Symbol rate errorMaximum packet length. Sensitivity better than –67 dBm, 250-byte
tolerance
(10)
250 kbps, MSK, 0.1% BER
Receiver sensitivity
SaturationBER < 0.1%0dBm
Co-channel rejectionWanted signal -67 dBm–5dB
In-band blocking rejection±2-MHz offset, 0.1% BER, wanted signal –67 dBm29dB
Frequency error tolerance–150150kHz
Symbol rate error tolerance–8080ppm
ALL RATES/FORMATS
Spurious emission in RX.
Conducted measurement
Spurious emission in RX.
Conducted measurement
(8) Results based on standard-gain mode.
(9) Difference between center frequency of the received RF signal and local oscillator frequency
(10) Difference between incoming symbol rate and the internally generated symbol rate
(11) Results based on high-gain mode.
(8)
(11)
–98dBm
±1-MHz offset, 0.1% BER, wanted signal –67 dBm23
>2-MHz offset, 0.1% BER, wanted signal –67 dBm29
Including both initial tolerance and drift. Sensitivity better than –67 dBm,
(9)
250-byte payload. BER 0.1%
payload. BER 0.1%
–150150kHz
–8080ppm
–99dBm
±1-MHz offset, 0.1% BER, wanted signal –67 dBm20
>2-MHz offset, 0.1% BER, wanted signal –67 dBm30
Including both initial tolerance and drift. Sensitivity better than –67 dBm,
250-byte payload. BER 0.1%
Maximum packet length. Sensitivity better than –67 dBm, 250-byte
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C, VDD = 3 V and fc= 2440 MHz
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Delivered to a single-ended 50-Ω load through a balun using
Output powerdBm
Programmable output powerDelivered to a single-ended 50-Ω load through a balun using23dB
rangeminimum recommended output power setting
Spurious emission conducted f > 1 GHz–48dBm
measurement
Optimum load impedance70 +j30Ω
maximum recommended output power setting
Delivered to a single-ended 50-Ω load through a balun using
minimum recommended output power setting
f < 1 GHz–52dBm
Suitable for systems targeting compliance with worldwide radio-frequency regulations ETSI EN 300 328 and
EN 300 440 Class 2 (Europe), FCC CFR47 Part 15 (US), and ARIB STD-T66 (Japan)
Differential impedance as seen from the RF port (RF_P and RF_N)
toward the antenna
0
–23
Designs with antenna connectors that require conducted ETSI compliance at 64 MHz should insert an LC
resonator in front of the antenna connector. Use a 1.6-nH inductor in parallel with a 1.8-pF capacitor. Connect
both from the signal trace to a good RF ground.
CURRENT CONSUMPTION WITH TPS62730
Measured on Texas Instruments CC2541 TPA62730 EM reference design with TA= 25°C, VDD = 3 V and fc= 2440 MHz,
1 Mbsp, GFSK, 250-kHz deviation, Bluetooth™ low energy Mode, 1% BER
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
RX mode, standard mode, no peripherals active, low MCU activity, MCU
at 1 MHz
RX mode, high-gain mode, no peripherals active, low MCU activity,
Current consumptionmA
(1) 0.1% BER maps to 30.8% PER
MCU at 1 MHz
TX mode, –20 dBm output power, no peripherals active, low MCU activity,13.1
MCU at 1 MHz
TX mode, 0 dBm output power, no peripherals active, low MCU activity,
MCU at 1 MHz
(1)
14.7
16.7
14.3
32-MHz CRYSTAL OSCILLATOR
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V
PARAMETERTEST CONDITIONSMINTYPMAX UNIT
Crystal frequency32MHz
Crystal frequency accuracy
requirement
ESREquivalent series resistance660Ω
C
Crystal shunt capacitance17pF
0
C
Crystal load capacitance1016pF
L
Start-up time0.25ms
Power-down guard time3ms
(1) Including aging and temperature dependency, as specified by [1]
The crystal oscillator must be in power down for a guard
time before it is used again. This requirement is valid for
all modes of operation. The need for power-down guard
time can vary with crystal type and load.
Product Folder Links: CC2541
–4040ppm
Page 9
CC2541
www.ti.com
SWRS110D –JANUARY 2012–REVISED JUNE 2013
32.768-kHz CRYSTAL OSCILLATOR
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Crystal frequency32.768kHz
Crystal frequency accuracy requirement
ESREquivalent series resistance40130kΩ
C
Crystal shunt capacitance0.92pF
0
C
Crystal load capacitance1216pF
L
Start-up time0.4s
(1) Including aging and temperature dependency, as specified by [1]
(1)
–4040ppm
32-kHz RC OSCILLATOR
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V.
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Calibrated frequency
Frequency accuracy after calibration±0.2%
Temperature coefficient
Supply-voltage coefficient
Calibration time
(1) The calibrated 32-kHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 977.
(2) Frequency drift when temperature changes after calibration
(3) Frequency drift when supply voltage changes after calibration
(4) When the 32-kHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
is performed while SLEEPCMD.OSC32K_CALDIS is set to 0.
(1)
(2)
(3)
(4)
32.753kHz
0.4%/°C
3%/V
2ms
16-MHz RC OSCILLATOR
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Frequency
Uncalibrated frequency accuracy±18%
Calibrated frequency accuracy±0.6%
Start-up time10μs
Initial calibration time
(1) The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.
(2) When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator
(1) Assuming CC2541 EM reference design. Other RF designs give an offset from the reported value.
(1)
(1)
(1)
(1)
(1)
(1)
Reduced gain by AGC algorithm64
High gain by AGC algorithm64
Reduced gain by AGC algorithm79
High gain by AGC algorithm99
±6dB
Standard mode64
High-gain mode64
Standard mode98
High-gain mode107
±3dB
dB
dBm
dB
dBm
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C, VDD = 3 V and fc= 2440 MHz
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
At ±1-MHz offset from carrier–109
Phase noise, unmodulated carrierAt ±3-MHz offset from carrier–112dBc/Hz
At ±5-MHz offset from carrier–119
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2541 EM reference design with TA= 25°C and VDD = 3 V
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Output148012-bit
Temperature coefficient4.5/ 1°C
Voltage coefficient10.1 V
Initial accuracy without calibration±10°C
Accuracy using 1-point calibration±5°C
Current consumption when enabled0.5mA
Measured using integrated ADC, internal band-gap voltage
reference, and maximum resolution
COMPARATOR CHARACTERISTICS
TA= 25°C, VDD = 3 V. All measurement results are obtained using the CC2541 reference designs, post-calibration.
PARAMETERTEST CONDITIONSMINTYP MAX UNIT
Common-mode maximum voltageVDDV
Common-mode minimum voltage–0.3
Input offset voltage1mV
Offset vs temperature16µV/°C
Offset vs operating voltage4mV/V
Supply current230nA
Hysteresis0.15mV
Input voltageVDD is voltage on AVDD5 pin0VDDV
External reference voltageVDD is voltage on AVDD5 pin0VDDV
External reference voltage differential VDD is voltage on AVDD5 pin0VDDV
Input resistance, signalSimulated using 4-MHz clock speed197kΩ
Full-scale signal
(1)
ENOB
Effective number of bitsbits
Useful power bandwidth7-bit setting, both single and differential0–20kHz
Power consumption1.2mA
Internal reference VDD coefficient4mV/V
Internal reference temperature
coefficient
Internal reference voltage1.24V
0.4mV/10°C
CONTROL INPUT AC CHARACTERISTICS
TA= –40°C to 85°C, VDD = 2 V to 3.6 V
PARAMETERTEST CONDITIONSMIN TYPMAXUNIT
System clock, f
t
SYSCLK
RESET_N low duration1µs
Interrupt pulse duration20ns
= 1/ f
SYSCLK
SYSCLK
The undivided system clock is 32 MHz when crystal oscillator is used.
The undivided system clock is 16 MHz when calibrated 16-MHz RC1632MHz
oscillator is used.
See item 1, Figure 2. This is the shortest pulse that is recognized as
a complete reset pin request. Note that shorter pulses may be
recognized but do not lead to complete reset of all modules within the
chip.
See item 2, Figure 2.This is the shortest pulse that is recognized as
an interrupt request.
Debug clock frequency (see Figure 5)12MHz
Allowed high pulse on clock (see Figure 5)35ns
Allowed low pulse on clock (see Figure 5)35ns
EXT_RESET_N low to first falling edge on debug clock (see
Figure 7)
Falling edge on clock to EXT_RESET_N high (see Figure 7)83ns
EXT_RESET_N high to first debug command (see Figure 7)83ns
Debug data setup (see Figure 6)2ns
Debug data hold (see Figure 6)4ns
Clock-to-data delay (see Figure 6)Load = 10 pF30ns
AVDD128Power (analog)2-V–3.6-V analog power-supply connection
AVDD227Power (analog)2-V–3.6-V analog power-supply connection
AVDD324Power (analog)2-V–3.6-V analog power-supply connection
AVDD429Power (analog)2-V–3.6-V analog power-supply connection
AVDD521Power (analog)2-V–3.6-V analog power-supply connection
AVDD631Power (analog)2-V–3.6-V analog power-supply connection
DCOUPL40Power (digital)1.8-V digital power-supply decoupling. Do not use for supplying external circuits.
DVDD139Power (digital)2-V–3.6-V digital power-supply connection
DVDD210Power (digital)2-V–3.6-V digital power-supply connection
GND1Ground pinConnect to GND
GND—GroundThe ground pad must be connected to a solid ground plane.
NC4Unused pinsNot connected
P0_019Digital I/OPort 0.0
P0_118Digital I/OPort 0.1
P0_217Digital I/OPort 0.2
P0_316Digital I/OPort 0.3
P0_415Digital I/OPort 0.4
P0_514Digital I/OPort 0.5
P0_613Digital I/OPort 0.6
P0_712Digital I/OPort 0.7
P1_011Digital I/OPort 1.0 – 20-mA drive capability
P1_19Digital I/OPort 1.1 – 20-mA drive capability
P1_28Digital I/OPort 1.2
P1_37Digital I/OPort 1.3
P1_46Digital I/OPort 1.4
P1_55Digital I/OPort 1.5
P1_638Digital I/OPort 1.6
P1_737Digital I/OPort 1.7
P2_036Digital I/OPort 2.0
P2_1/DD35Digital I/OPort 2.1 / debug data
P2_2/DC34Digital I/OPort 2.2 / debug clock
P2_3/33Digital I/O, Analog I/OPort 2.3/32.768 kHz XOSC
OSC32K_Q2
P2_4/32Digital I/O, Analog I/OPort 2.4/32.768 kHz XOSC
OSC32K_Q1
RBIAS30Analog I/OExternal precision bias resistor for reference current
RESET_N20Digital inputReset, active-low
RF_N26RF I/ONegative RF input signal to LNA during RX
RF_P25RF I/OPositive RF input signal to LNA during RX
SCL2I2C clock or digital I/OCan be used as I2C clock pin or digital I/O. Leave floating if not used. If grounded
SDA3I2C clock or digital I/OCan be used as I2C data pin or digital I/O. Leave floating if not used. If grounded
A block diagram of the CC2541 is shown in Figure 9. The modules can be roughly divided into one of three
categories: CPU-related modules; modules related to power, test, and clock distribution; and radio-related
modules. In the following subsections, a short description of each module is given.
A block diagram of the CC2541 is shown in Figure 9. The modules can be roughly divided into one of three
categories: CPU-related modules; modules related to power, test, and clock distribution; and radio-related
modules. In the following subsections, a short description of each module is given.
CPU and Memory
The 8051 CPU core is a single-cycle 8051-compatible core. It has three different memory access busses (SFR,
DATA, and CODE/XDATA), a debug interface, and an 18-input extended interrupt unit.
The memory arbiter is at the heart of the system, as it connects the CPU and DMA controller with the physical
memories and all peripherals through the SFR bus. The memory arbiter has four memory-access points, access
of which can map to one of three physical memories: an SRAM, flash memory, and XREG/SFR registers. It is
responsible for performing arbitration and sequencing between simultaneous memory accesses to the same
physical memory.
The SFR bus is drawn conceptually in Figure 9 as a common bus that connects all hardware peripherals to the
memory arbiter. The SFR bus in the block diagram also provides access to the radio registers in the radio
register bank, even though these are indeed mapped into XDATA memory space.
The 8-KB SRAM maps to the DATA memory space and to parts of the XDATA memory spaces. The SRAM is
an ultralow-power SRAM that retains its contents even when the digital part is powered off (power mode 2 and
mode 3).
The 128/256 KB flash block provides in-circuit programmable non-volatile program memory for the device, and
maps into the CODE and XDATA memory spaces.
Peripherals
Writing to the flash block is performed through a flash controller that allows page-wise erasure and 4-bytewise
programming. See User Guide for details on the flash controller.
A versatile five-channel DMA controller is available in the system, accesses memory using the XDATA memory
space, and thus has access to all physical memories. Each channel (trigger, priority, transfer mode, addressing
mode, source and destination pointers, and transfer count) is configured with DMA descriptors that can be
located anywhere in memory. Many of the hardware peripherals (AES core, flash controller, USARTs, timers,
ADC interface, etc.) can be used with the DMA controller for efficient operation by performing data transfers
between a single SFR or XREG address and flash/SRAM.
Each CC2541 contains a unique 48-bit IEEE address that can be used as the public device address for a
Bluetooth device. Designers are free to use this address, or provide their own, as described in the Bluetooth
specfication.
The interrupt controller services a total of 18 interrupt sources, divided into six interrupt groups, each of which
is associated with one of four interrupt priorities. I/O and sleep timer interrupt requests are serviced even if the
device is in a sleep mode (power modes 1 and 2) by bringing the CC2541 back to the active mode.
The debug interface implements a proprietary two-wire serial interface that is used for in-circuit debugging.
Through this debug interface, it is possible to erase or program the entire flash memory, control which oscillators
are enabled, stop and start execution of the user program, execute instructions on the 8051 core, set code
breakpoints, and single-step through instructions in the code. Using these techniques, it is possible to perform incircuit debugging and external flash programming elegantly.
The I/O controller is responsible for all general-purpose I/O pins. The CPU can configure whether peripheral
modules control certain pins or whether they are under software control, and if so, whether each pin is configured
as an input or output and if a pullup or pulldown resistor in the pad is connected. Each peripheral that connects
to the I/O pins can choose between two different I/O pin locations to ensure flexibility in various applications.
The sleep timer is an ultralow-power timer that can either use an external 32.768-kHz crystal oscillator or an
internal 32.753-kHz RC oscillator. The sleep timer runs continuously in all operating modes except power mode
3. Typical applications of this timer are as a real-time counter or as a wake-up timer to get out of power mode 1
or mode 2.
A built-in watchdog timer allows the CC2541 to reset itself if the firmware hangs. When enabled by software,
the watchdog timer must be cleared periodically; otherwise, it resets the device when it times out.
Timer 1 is a 16-bit timer with timer/counter/PWM functionality. It has a programmable prescaler, a 16-bit period
value, and five individually programmable counter/capture channels, each with a 16-bit compare value. Each of
the counter/capture channels can be used as a PWM output or to capture the timing of edges on input signals. It
can also be configured in IR generation mode, where it counts timer 3 periods and the output is ANDed with the
output of timer 3 to generate modulated consumer IR signals with minimal CPU interaction.
Timer 2 is a 40-bit timer. It has a 16-bit counter with a configurable timer period and a 24-bit overflow counter
that can be used to keep track of the number of periods that have transpired. A 40-bit capture register is also
used to record the exact time at which a start-of-frame delimiter is received/transmitted or the exact time at which
transmission ends. There are two 16-bit output compare registers and two 24-bit overflow compare registers that
can be used to give exact timing for start of RX or TX to the radio or general interrupts.
Timer 3 and timer 4 are 8-bit timers with timer/counter/PWM functionality. They have a programmable prescaler,
an 8-bit period value, and one programmable counter channel with an 8-bit compare value. Each of the counter
channels can be used as PWM output.
USART 0 and USART 1 are each configurable as either an SPI master/slave or a UART. They provide double
buffering on both RX and TX and hardware flow control and are thus well suited to high-throughput full-duplex
applications. Each USART has its own high-precision baud-rate generator, thus leaving the ordinary timers free
for other uses. When configured as SPI slaves, the USARTs sample the input signal using SCK directly instead
of using some oversampling scheme, and are thus well-suited for high data rates.
The AES encryption/decryption core allows the user to encrypt and decrypt data using the AES algorithm with
128-bit keys. The AES core also supports ECB, CBC, CFB, OFB, CTR, and CBC-MAC, as well as hardware
support for CCM.
The ADC supports 7 to 12 bits of resolution with a corresponding range of bandwidths from 30-kHz to 4-kHz,
respectively. DC and audio conversions with up to eight input channels (I/O controller pins) are possible. The
inputs can be selected as single-ended or differential. The reference voltage can be internal, AVDD, or a singleended or differential external signal. The ADC also has a temperature-sensor input channel. The ADC can
automate the process of periodic sampling or conversion over a sequence of channels.
The I2C module provides a digital peripheral connection with two pins and supports both master and slave
operation. I2C support is compliant with the NXP I2C specification version 2.1 and supports standard mode (up to
100 kbps) and fast mode (up to 400 kbps). In addition, 7-bit device addressing modes are supported, as well as
master and slave modes.
The ultralow-power analog comparator enables applications to wake up from PM2 or PM3 based on an analog
signal. Both inputs are brought out to pins; the reference voltage must be provided externally. The comparator
output is connected to the I/O controller interrupt detector and can be treated by the MCU as a regular I/O pin
interrupt.
(1) Measured on Texas Instruments CC2541 EM reference design with TA= 25°C, VDD = 3 V and fc=
2440 MHz. See SWRU191 for recommended register settings.
(2) Measured on Texas Instruments CC2541 TPS62730 EM reference design with TA= 25°C, VDD = 3 V
and fc= 2440 MHz. See SWRU191 for recommended register settings.
Typical Current ConsumptionTypical Current Consumption
(mA)
(1)
TYPICAL CURRENT SAVINGS WHEN USING TPS62730
SWRS110D –JANUARY 2012–REVISED JUNE 2013
With TPS62730 (mA)
(2)
Figure 20. Current Savings in TX at RoomFigure 21. Current Savings in RX at Room
TemperatureTemperature
The application note (SWRA365) has information regarding the CC2541 and TPS62730 combo board and the
current savings that can be achieved using the combo board.
Power Supply Decoupling Capacitors are Not Shown
Digital I/O Not Connected
CC2541
SWRS110D –JANUARY 2012–REVISED JUNE 2013
www.ti.com
APPLICATION INFORMATION
Few external components are required for the operation of the CC2541. A typical application circuit is shown in
Figure 22.
ComponentDescriptionValue
Input/Output Matching
When using an unbalanced antenna such as a monopole, a balun should be used to optimize performance. The
balun can be implemented using low-cost discrete inductors and capacitors. See reference design, CC2541EM,
for recommended balun.
(1) 32-kHz crystal is mandatory when running the BLE protocol stack in low-power modes, except if the link layer is in
the standby state (Vol. 6 Part B Section 1.1 in [1]).
NOTE: Different antenna alternatives will be provided as reference designs.
Figure 22. CC2541 Application Circuit
Table 3. Overview of External Components (Excluding Supply Decoupling Capacitors)
C401Decoupling capacitor for the internal 1.8-V digital voltage regulator1 µF
R301Precision resistor ±1%, used for internal biasing56 kΩ
An external 32-MHz crystal, XTAL1, with two loading capacitors (C221 and C231) is used for the 32-MHz crystal
oscillator. See 32-MHz CRYSTAL OSCILLATOR for details. The load capacitance seen by the 32-MHz crystal is
given by:
(1)
XTAL2 is an optional 32.768-kHz crystal, with two loading capacitors (C321 and C331) used for the 32.768-kHz
crystal oscillator. The 32.768-kHz crystal oscillator is used in applications where both very low sleep-current
consumption and accurate wake-up times are needed. The load capacitance seen by the 32.768-kHz crystal is
given by:
(2)
A series resistor may be used to comply with the ESR requirement.
On-Chip 1.8-V Voltage Regulator Decoupling
The 1.8-V on-chip voltage regulator supplies the 1.8-V digital logic. This regulator requires a decoupling capacitor
(C401) for stable operation.
Power-Supply Decoupling and Filtering
Proper power-supply decoupling must be used for optimum performance. The placement and size of the
decoupling capacitors and the power supply filtering are very important to achieve the best performance in an
application. TI provides a compact reference design that should be followed very closely.
References
1. Bluetooth® Core Technical Specification document, version 4.0
2. CC253x System-on-Chip Solution for 2.4-GHz IEEE 802.15.4 and ZigBee®Applications/CC2541 System-onChip Solution for 2.4-GHz Bluetooth low energy Applications (SWRU191)
3. Current Savings in CC254x Using the TPS62730 (SWRA365).
Additional Information
Texas Instruments offers a wide selection of cost-effective, low-power RF solutions for proprietary and standardbased wireless applications for use in industrial and consumer applications. Our selection includes RF
transceivers, RF transmitters, RF front ends, and System-on-Chips as well as various software solutions for the
sub-1- and 2.4-GHz frequency bands.
In addition, Texas Instruments provides a large selection of support collateral such as development tools,
technical documentation, reference designs, application expertise, customer support, third-party and university
programs.
The Low-Power RF E2E Online Community provides technical support forums, videos and blogs, and the chance
to interact with fellow engineers from all over the world.
With a broad selection of product solutions, end application possibilities, and a range of technical support, Texas
Instruments offers the broadest low-power RF portfolio. We make RF easy!
The following subsections point to where to find more information.
•E2E interaction
Join us today at www.ti.com/lprf-forum.
Texas Instruments Low-Power RF Developer Network
Texas Instruments has launched an extensive network of low-power RF development partners to help customers
speed up their application development. The network consists of recommended companies, RF consultants, and
independent design houses that provide a series of hardware module products and design services, including:
•RF circuit, low-power RF, and ZigBee®design services
•Low-power RF and ZigBee module solutions and development tools
•RF certification services and RF circuit manufacturing
Need help with modules, engineering services or development tools?
Search the Low-Power RF Developer Network tool to find a suitable partner.
www.ti.com/lprfnetwork
Low-Power RF eNewsletter
The Low-Power RF eNewsletter keeps you up-to-date on new products, news releases, developers’ news, and
other news and events associated with low-power RF products from TI. The Low-Power RF eNewsletter articles
include links to get more online information.
Sign up today on
www.ti.com/lprfnewsletter
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REVISION HISTORY
Changes from Original (January 2012) to Revision APage
•Changed data sheet status from Product Preview to Production Data ................................................................................ 1
Changes from Revision A (February 2012) to Revision BPage
•Changed the Temperature coefficient Unit value From: mV/°C To: / 0.1°C ....................................................................... 10
•Changed Figure 22 text From: Optional 32-kHz Crystal To: 32-kHz Crystal ..................................................................... 24
Changes from Revision B (August 2012) to Revision CPage
•Changed the "Internal reference voltage" TYP value From 1.15 V To: 1.24 V .................................................................. 12
•Changed pin XOSC_Q1 Pin Type From Analog O To: Analog I/O, and changed the Pin Description .............................. 17
•Changed pin XOSC_Q2 Pin Type From Analog O To: Analog I/O .................................................................................... 17
Changes from Revision C (November 2012) to Revision DPage
•Changed the RF TRANSMIT SECTION, Output power TYP value From: –20 To: –23 ....................................................... 8
•Changed the RF TRANSMIT SECTION, Programmable output power range TYP value From: 20 To: 23 ........................ 8
•Added row 0x31 to Table 1 ................................................................................................................................................. 22
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
Package Type Package
(1)
Drawing
Pins Package
Qty
Eco Plan
(2)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
& no Sb/Br)
Lead/Ball Finish
(6)
CU NIPDAULevel-3-260C-168 HR-40 to 85CC2541
CU NIPDAULevel-3-260C-168 HR-40 to 85CC2541
CU NIPDAULevel-3-260C-168 HR-40 to 85CC2541
CU NIPDAULevel-3-260C-168 HR-40 to 85CC2541
MSL Peak Temp
(3)
Op Temp (°C)Device Marking
F128
F128
F256
F256
(4/5)
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Samples
Addendum-Page 1
Page 28
PACKAGE OPTION ADDENDUM
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Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
23-Sep-2014
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF CC2541 :
Automotive: CC2541-Q1
•
NOTE: Qualified Version Definitions:
Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
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