The M48Z2M1Y/V ZEROPOWER® RAM is a non-volatile 16,777,216-bit, static RAM
organized as 2,097,152 words by 8 bits. The device combines two internal lithium batteries,
CMOS SRAMs and a control circuit in a plastic 36-pin DIP, long module.
The ZEROPOWER RAM replaces industry standard SRAMs. It provides the non-volatility of
PROMs without any requirement for special WRITE timing or limitations on the number of
WRITEs that can be performed.
Figure 1.Logic diagram
V
CC
Table 1.Signal names
A0-A20Address inputs
DQ0-DQ7Data inputs / outputs
EChip enable
GOutput enable
WWRITE enable
V
CC
V
SS
NCNot connected internally
21
A0-A20
W
E
G
Supply voltage
Ground
M48Z2M1Y
M48Z2M1V
V
SS
8
DQ0-DQ7
AI02048
Doc ID 5135 Rev 65/20
Page 6
DescriptionM48Z2M1Y, M48Z2M1V
Figure 2.DIP connections
Figure 3.Block diagram
E
VOLTAGE SENSE
SWITCHING
CIRCUITRY
V
CC
AND
NC
A20
A18
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ2
V
SS
INTERNAL
BATTERIES
1
2
3
4
5
6
7
8
M48Z2M1Y
9
M48Z2M1V
10
11
12
13
14
15
16
17
18
POWER
E
V
36
CC
A19
35
34
NC
A15
33
A17
32
W
31
A13
30
A8
29
A9
28
27
A11
G
26
A10
25
E
24
DQ7
23
DQ6
22
DQ5DQ1
21
DQ4
20
DQ3
19
2048K x 8
SRAM ARRAY
AI02049
A0-A20
DQ0-DQ7
W
G
6/20Doc ID 5135 Rev 6
V
SS
AI02050
Page 7
M48Z2M1Y, M48Z2M1VOperation modes
2 Operation modes
The M48Z2M1Y/V has its own power-fail detect circuit. The control circuitry constantly
monitors the single 5 V supply for an out of tolerance condition. When V
tolerance, the circuit write protects the SRAM, providing a high degree of data security in the
midst of unpredictable system operations brought on by low V
. As VCC falls below
CC
approximately 3 V, the control circuitry connects the batteries which sustain data until valid
power returns.
Table 2.Operating modes
ModeV
CC
EGW
DQ0-
DQ7
is out of
CC
Power
Deselect
WRITEV
READV
3.0 to 3.6 V
4.5 to 5.5 V
READV
DeselectVSO to V
Deselect≤ V
1. See Table 10 on page 15 for details.
Note:X = V
or VIL; VSO = battery backup switchover voltage.
IH
2.1 READ mode
The M48Z2M1Y/V is in the READ mode whenever W (WRITE enable) is high and E (chip
enable) is low. The device architecture allows ripple-through access of data from eight of
16,777,216 locations in the static storage array. Thus, the unique address specified by the
21 address inputs defines which one of the 2,097,152 bytes of data is to be accessed. Valid
data will be available at the data I/O pins within address access time (t
address input signal is stable, providing that the E
access times are also satisfied. If the E
available after the later of chip enable access time (t
(t
). The state of the eight three-state data I/O signals is controlled by E and G. If the
GLQV
outputs are activated before t
until t
remain valid for output data hold time (t
access.
. If the address inputs are changed while E and G remain low, output data will
AVQ V
or
PFD
SO
(min)
(1)
XXHigh ZStandby
XVILD
V
IL
V
IH
V
IH
V
IH
IN
D
OUT
High ZActive
(1)
V
IH
IL
IL
IL
XXXHigh ZCMOS standby
XXXHigh ZBattery backup mode
) after the last
AVQ V
(chip enable) and G (output enable)
and G access times are not met, valid data will be
) or output enable access time
ELQV
, the data lines will be driven to an indeterminate state
AVQ V
) but will go indeterminate until the next address
AXQX
Active
Active
Figure 4.Address controlled, READ mode AC waveforms
Figure 5.Chip enable or output enable controlled, READ mode AC waveforms
tAVAV
tGLQV
VALID
tEHQZ
tGHQZ
DATA OUT
AI02052
A0-A20
tAVQVtAXQX
tELQV
E
tELQX
G
tGLQX
DQ0-DQ7
Note:WRITE enable (W
Table 3.READ mode AC characteristics
SymbolParameter
t
AVAV
t
AVQ V
t
AXQX
t
EHQZ
t
ELQV
t
ELQX
t
GHQZ
t
GLQV
t
GLQX
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
noted).
2. CL = 100 pF or 50 pF (see Figure 9 on page 13).
3. CL = 5 pF (see Figure 9 on page 13).
READ cycle time7085ns
(2)
Address valid to output valid7085ns
(2)
Address transition to output transition55ns
(3)
Chip enable high to output Hi-Z3035ns
(2)
Chip enable low to output valid7085ns
(3)
Chip enable low to output transition55ns
(3)
Output enable high to output Hi-Z2535ns
(2)
Output enable low to output valid3545ns
(3)
Output enable low to output transition55ns
) = high.
(1)
M48Z2M1YM48Z2M1V
Unit–70–85
MinMaxMinMax
8/20Doc ID 5135 Rev 6
Page 9
M48Z2M1Y, M48Z2M1VOperation modes
2.2 WRITE mode
The M48Z2M1Y/V is in the WRITE mode whenever W and E are active. The start of a
WRITE is referenced from the latter occurring falling edge of W
by the earlier rising edge of W
or E.
or E. A WRITE is terminated
The addresses must be held valid throughout the cycle. E
minimum of t
EHAX
cycle. Data-in must be valid t
t
EHDX
or t
afterward. G should be kept high during WRITE cycles to avoid bus
WHDX
contention; although, if the output bus has been activated by a low on E
will disable the outputs t
Figure 6.WRITE enable controlled, WRITE mode AC waveforms
A0-A20
E
W
DQ0-DQ7
Note:Output enable (G
from E or t
WLQZ
) = high.
or W must return high for
from W prior to the initiation of another READ or WRITE
WHAX
DVE H
or t
prior to the end of WRITE and remain valid for
DVW H
and G, a low on W
after W falls.
tAVAV
VALID
tAVWH
tAVEL
tWLWH
tAVWL
tWLQZ
tWHDX
DATA INPUT
tDVWH
tWHAX
tWHQX
AI02053
Figure 7.Chip enable controlled, WRITE mode AC waveforms
A0-A20
E
W
DQ0-DQ7
Note:Output enable (G
) = high.
tAVAV
VALID
tAVEH
tAVEL
tELEH
tAVWL
DATA INPUT
tDVEH
tEHAX
tEHDX
Doc ID 5135 Rev 69/20
AI02054
Page 10
Operation modesM48Z2M1Y, M48Z2M1V
Table 4.WRITE mode AC characteristics
M48Z2M1YM48Z2M1V
SymbolParameter
(1)
Unit–70–85
MinMaxMinMax
t
AVAV
t
AVEH
t
AVEL
t
AVW H
t
AVW L
t
DVEH
t
DVW H
t
EHAX
t
EHDX
t
ELEH
t
WHAX
t
WHDX
t
WHQX
t
WLQZ
t
WLWH
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6V (except where
noted).
2. CL = 5 pF (see Figure 9 on page 13).
goes low simultaneously with W going low, the outputs remain in the high impedance state.
3. If E
WRITE cycle time7085ns
Address valid to chip enable high6575ns
Address valid to chip enable low00ns
Address valid to WRITE enable high6575ns
Address valid to WRITE enable low00ns
Input valid to chip enable high3035ns
Input valid to WRITE enable high3035ns
Chip enable high to address transition1515ns
Chip enable high to input transition1015ns
Chip enable low to chip enable high5575ns
WRITE enable high to address transition55ns
WRITE enable high to input transition00ns
(2)(3)
WRITE enable high to output transition55ns
(2)(3)
WRITE enable low to output Hi-Z2530ns
WRITE enable pulse width5565ns
2.3 Data retention mode
With valid VCC applied, the M48Z2M1Y/V operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically power-fail deselect, write
protecting itself t
inputs are treated as “Don't care.”
If power fail detection occurs during a valid access, the memory cycle continues to
completion. If the memory cycle fails to terminate within the time t
place. When V
source which preserves data.
The internal coin cells will maintain data in the M48Z2M1Y/V after the initial application of
V
for an accumulated period of at least 10 years when VCC is less than VSO. As system
CC
power returns and V
supply is switched to external V
V
to allow for processor stabilization. After tER, normal RAM operation can resume.
PFD
For more information on battery storage life refer to the application note AN1012.
10/20Doc ID 5135 Rev 6
after VCC falls below V
WP
drops below VSO, the control circuit switches power to the internal energy
CC
rises above VSO, the batteries are disconnected, and the power
CC
. Write protection continues for t
CC
. All outputs become high impedance, and all
PFD
, write protection takes
WP
after VCC reaches
ER
Page 11
M48Z2M1Y, M48Z2M1VOperation modes
2.4 VCC noise and negative going transients
ICC transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the V
capacitors are used to store energy which stabilizes the V
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (as shown in
Figure 8) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on V
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, it is recommended to connect a
schottky diode from V
to VSS (cathode connected to VCC, anode to VSS). Schottky diode
CC
1N5817 is recommended for through hole and MBRS120T3 is recommended for surface
mount.
Figure 8.Supply voltage protection
V
CC
bus. These transients can be reduced if
CC
that drive it to values below VSS by as much as
CC
V
CC
bus. The energy stored in the
CC
0.1µFDEVICE
V
SS
AI02169
Doc ID 5135 Rev 611/20
Page 12
Maximum ratingsM48Z2M1Y, M48Z2M1V
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 5.Absolute maximum ratings
SymbolParameterValueUnit
T
A
T
STG
T
BIAS
T
SLD
V
IO
V
CC
I
O
P
1. Soldering temperature of the IC leads is to not exceed 260 °C for 10 seconds. Furthermore, the devices
shall not be exposed to IR reflow nor preheat cycles (as performed as part of wave soldering). ST
recommends the devices be hand-soldered or placed in sockets to avoid heat damage to the batteries.
Ambient operating temperature0 to 70°C
Storage temperature (VCC off)–40 to 85°C
Temperature under bias–40 to 85°C
(1)
Lead solder temperature for 10 seconds260°C
Input or output voltages
Supply voltage
M48Z2M1Y–0.3 to 7V
M48Z2M1V–0.3 to 4.6V
M48Z2M1Y–0.3 to 7V
M48Z2M1V–0.3 to 4.6V
Output current20mA
Power dissipation1W
D
Caution:Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
12/20Doc ID 5135 Rev 6
Page 13
M48Z2M1Y, M48Z2M1VDC and AC parameters
4 DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC characteristic
tables are derived from tests performed under the measurement conditions listed in the
relevant tables. Designers should check that the operating conditions in their projects match
the measurement conditions when using the quoted parameters.
Table 6.Operating and AC measurement conditions
ParameterM48Z2M1YM48Z2M1VUnit
Supply voltage (VCC)4.5 to 5.53.0 to 3.6V
Ambient operating temperature (T
Load capacitance (CL)10050pF
Input rise and fall times≤ 5≤ 5ns
Input pulse voltages0 to 30 to 3V
Input and output timing ref. voltages1.51.5V
Note:Output Hi-Z is defined as the point where data is no longer driven.
)0 to 700 to 70°C
A
Figure 9.AC testing load circuit
DEVICE
UNDER
TEST
1kΩ
CL includes JIG capacitance
5V
1.9kΩ
CL = 100pF or 5pF (Y)
OUT
50pF or 5pF (V)
AI07816
Doc ID 5135 Rev 613/20
Page 14
DC and AC parametersM48Z2M1Y, M48Z2M1V
Table 7.Capacitance
SymbolParameter
(1)(2)
MinMaxUnit
C
IN
C
IO
1. Effective capacitance measured with power supply at 5 V; sampled only, not 100% tested.
2. Outputs deselected.
3. At 25 °C.
Input capacitance-40pF
(3)
Input / output capacitance-40pF
Table 8.DC characteristics
M48Z2M1YM48Z2M1V
MinMaxMinMax
±4±4µA
±4±4µA
14070mA
102mA
≤ V
IH
(1)
CC
CC
SymParameterTest condition
(2)
Input leakage current0 V ≤ VIN ≤ V
I
LI
(2)
I
Output leakage current0 V ≤ V
LO
Supply current
I
CC
Supply current (standby) TTLE = V
I
CC1
Supply current (standby) CMOSE ≥ VCC – 0.2 V81mA
I
CC2
OUT
E
= VIL,
Outputs open
VILInput low voltage–0.30.8–0.30.6V
VIHInput high voltage2.2VCC + 0.32.2VCC + 0.3V
Output low voltageIOL = 2.1 mA0.40.4V
V
OL
V
Output high voltageIOH = –1 mA2.42.2V
OH
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where noted).
2. Outputs deselected.
Unit
14/20Doc ID 5135 Rev 6
Page 15
M48Z2M1Y, M48Z2M1VDC and AC parameters
Figure 10. Power down/up mode AC waveforms
V
CC
V
(max)
PFD
V
(min)
PFD
VSO
tF
tFB
tWP
E
tDR
DON'T CARE
tR
tRB
tER
RECOGNIZEDRECOGNIZED
OUTPUTS
VAL IDVALID
(PER CONTROL INPUT)
HIGH-Z
(PER CONTROL INPUT)
AI01031
Table 9.Power down/up AC characteristics
SymbolParameter
t
ER
(2)
t
F
(3)
t
FB
t
R
t
WP
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
noted).
2. V
3. V
(max) to V
PFD
until 200 µs after V
PFD
E recovery time40120ms
V
(max) to V
PFD
V
(min) to VSO VCC fall time
PFD
V
(min) to V
PFD
(min) VCC fall time300µs
PFD
(max) VCC rise time10µs
PFD
Write protect time from VCC = V
(min) fall time of less than tF may result in deselection/write protection not occurring
PFD
passes V
CC
(min) to VSS fall time of less than tFB may cause corruption of RAM data.
PFD
(min).
(1)
PFD
MinMaxUnit
M48Z2M1Y10µs
M48Z2M1V150µs
M48Z2M1Y40150µs
M48Z2M1V40250µs
Table 10.Power down/up trip points DC characteristics
SymbolParameter
(1)(2)
MinTypMaxUnit
V
t
V
DR
Power-fail deselect voltage
PFD
Battery backup switchover voltage
SO
(3)
Expected data retention time10YEARS
1. All voltages referenced to VSS.
2. Valid for ambient operating temperature: T
noted).
3. At 25 °C; VCC = 0 V.
Doc ID 5135 Rev 615/20
M48Z2M1Y4.24.34.5V
M48Z2M1V2.82.93.0V
M48Z2M1Y3.0V
M48Z2M1V2.45V
= 0 to 70 °C; VCC = 4.5 to 5.5 V or 3.0 to 3.6 V (except where
A
Page 16
Package mechanical dataM48Z2M1Y, M48Z2M1V
5 Package mechanical data
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK
®
packages, depending on their level of environmental compliance. ECOPACK®
Devices are not recommended for new design (updated cover page,
Ta bl e 1 2 ); updated footnote of Table 5: Absolute maximum ratings;
updated Section 7: Environmental information.
Doc ID 5135 Rev 619/20
Page 20
M48Z2M1Y, M48Z2M1V
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