Datasheet IRF3415S, IRF3415L Datasheet (International Rectifier)

Page 1
PD - 91509C
IRF3415S/L
HEXFET® Power MOSFET
l Advanced Process Technology l Surface Mount (IRF3415S) l Low-profile through-hole (IRF3415L) l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated
Description
G
D
V
R
DS(on)
= 150V
DSS
= 0.042
ID = 43A
S
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
2
Pak is a surface mount power package capable of
The D accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on-
2
D Pak
TO-262
resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF3415L) is available for low­profile applications.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 43 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 30 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 200 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  5.0 V/ns T
J
T
STG
Pulsed Drain Current  150
Linear Derating Factor 1.3 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 590 mJ Avalanche Current 22 A Repetitive Avalanche Energy 20 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Thermal Resistance
Parameter Typ. Max. Units
R
θJC
R
θJA
Junction-to-Case ––– 0.75 Junction-to-Ambient ( PCB Mounted,steady-state)** –– – 40
°C/W
°C
5/13/98
Page 2
IRF3415S/L
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
S
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 150 ––– ––– V VGS = 0V, ID = 250µA
/T
Breakdown Voltage Temp. Coefficient ––– 0.17 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.042 VGS = 10V, ID = 22A Gate Threshold Voltage 2 .0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 19 ––– ––– S VDS = 50V, ID = 22A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 120V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 150V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– ––– 200 ID = 22A Gate-to-Source Charge ––– ––– 17 nC VDS = 120V Gate-to-Drain ("Miller") Charge ––– ––– 98 VGS = 10V, See Fig. 6 and 13  Turn-On Delay Time ––– 12 ––– VDD = 75V Rise Time ––– 55 ––– ID = 22A Turn-Off Delay Time ––– 71 –– – RG = 2.5
ns
Fall Time ––– 69 ––– RD = 3.3Ω, See Fig. 10  Internal Source Inductance
––– –––
7.5
Between lead,
nH
and center of die contact Input Capacitance ––– 2400 ––– VGS = 0V Output Capacitance ––– 640 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 340 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Starting T
RG = 25, I
I
SD
TJ ≤ 175°C
** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended soldering techniques refer to application note #AN-994.
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode) 
––– –––
––– –––
43
150
Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 22A, VGS = 0V Reverse Recovery Time ––– 260 390 ns TJ = 25°C, IF = 22A Reverse Recovery Charge ––– 2.2 3.3 µC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width 300µs; duty cycle ≤ 2%.
= 25°C, L = 2.4mH
J
= 22A. (See Figure 12)
AS
22A, di/dt 820A/µs, V
DD
V
(BR)DSS
Uses IRF3415 data and test conditions
,
showing the
A
p-n junction diode.

D
G
S
Page 3
IRF3415S/L
1000
100
D
I , Drain-to-Source Current (A)
10
1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.5V
4.5V
5.0V
BOTTOM
4.5V
20us PULSE WIDTH T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
o
Fig 1. Typical Output Characteristics
1000
1000
100
TOP
BOTTOM
VGS 15V 10V
8.0V
7.0V
6.0V
5.5V
5.5V
4.5V
5.0V
4.5V
D
I , Drain-to-Source Current (A)
20us PULSE WIDTH
10
1 10 100
V , Drain-to-Source Voltage (V)
DS
T = 175 C
o
J
Fig 2. Typical Output Characteristics
3.0
I =
D
37A
°
T = 25 C
J
100
D
I , Drain-to-Source Current (A)
10
4 5 6 7 8 9 10
V , Gate-to-Source Voltage (V)
GS
T = 175 C
J
V = 50V
DS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
2.5
2.0
°
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature ( C)
J
V =
GS
o
10V
Fig 4. Normalized On-Resistance
Vs. Temperature
Page 4
IRF3415S/L
6000
5000
4000
3000
2000
C, Capacitance (pF)
1000
0
1 10 100
V
=
0V,
GS
C
=
issgsgd , ds
C
=
rssgd
C
=
oss dsgd
C
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
f = 1MHz
C
+ C
C SHORTED C C
+ C
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
1000
20
I =
22A
D
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
V = 120V
DS
V = 75V
DS
V = 30V
DS
FOR TEST CIRCUIT
0
0 40 80 120 160 200
Q , Total Gate Charge (nC)
G
SEE FIGURE
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
13
100
o
T = 175 C
J
10
o
T = 25 C
J
1
SD
I , Reverse Drain Current (A)
V = 0 V
0.1
0.2 0.6 1.0 1.4 1.8
V ,Source-to-Drain Voltage (V)
SD
GS
Fig 7. Typical Source-Drain Diode
Forward Voltage
100
10
D
I , Drain Current (A)I , Drain Current (A)
o
= 25 C
C
T T= 175 C Single Pulse
1
1 10 100 1000
o
J
V , Drain-to-Source Voltage (V)
DS
10us
100us
1ms
10ms
Fig 8. Maximum Safe Operating Area
Page 5
IRF3415S/L
R
D.U.T.
D
+
V
DD
-
50
40
V
DS
V
GS
R
G
30
20
D
I , Drain Current (A)
10
Fig 10a. Switching Time Test Circuit
V
DS
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
90%
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
Fig 9. Maximum Drain Current Vs.
°
10% V
GS
t
d(on)tr
t
d(off)tf
Case Temperature
Fig 10b. Switching Time Waveforms
1
D = 0.50
thJC
0.20
0.1
0.10 P
1 2
DM
t
1
t
2
0.05
Thermal Response (Z )
0.01
0.02
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Page 6
IRF3415S/L
A
15V
DRIVER
+
-
R
20V
V
DS
G
t
L
D.U.T
I
AS
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
1400
1200
TOP BOTTOM
1000
800
V
DD
600
400
200
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature ( C)
J
o
I
D
9.0A 16A 22A
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
I
AS
Fig 12b. Unclamped Inductive Waveforms
Q
G
10 V
Q
GS
V
G
Q
GD
Charge
Fig 13a. Basic Gate Charge Waveform
Current Regulator
Same Type as D.U.T.
50K
.2µF
12V
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
D
Fig 13b. Gate Charge Test Circuit
V
DS
-
Page 7
IRF3415S/L
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance Current Transformer
-
-
dv/dt controlled by R
Driver same type as D.U.T.
G
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
Period
D =
P.W.
Period
+
+
V
DD
-
VGS=10V
*
Reverse Recovery Current
Re-Applied Voltage
D.U.T. ISDWaveform
Body Diode Forward
D.U.T. VDSWaveform
Body Diode Forward Drop
Inductor Curent
Ripple 5%
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-Channel HEXFETS
Current
di/dt
Diode Recovery
dv/dt
V
DD
I
SD
Page 8
IRF3415S/L
A
D2Pak Package Outline
10.54 (.415)
1.40 (.055) MAX.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTE S: 1 DIMENSIONS AFTER SOLDER DIP. 2 DIMENSIONING & TOLERANCING PER ANSI Y14.5M, 1982. 3 CONTROLLING DIMENSION : INCH. 4 HEATSINK & LEAD DIM ENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A ­2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.2 5 ( .0 10) M B A M
Part Marking Information
D2Pak
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
LEAD ASSIGNMENTS 1 - G ATE 2 - D RAIN 3 - S OU R CE
10.16 (.400) REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350) REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082) 2X
2.54 (.100) 2X
INTERNATIONAL RE CTIFIER LO G O
A S SEMBLY LO T CO D E
F530S
9246
9 B 1 M
PART NUM B ER
DATE CODE (YYW W ) YY = YEAR WW = WEEK
Page 9
Package Outline
TO-262 Outline
IRF3415S/L
Part Marking Information
TO-262
Page 10
IRF3415S/L
Tape & Reel Information
D2Pak
TRR
1.60 (.063)
1.50 (.059)
4.10 (.16 1)
3.90 (.15 3)
1.60 (.063)
1.50 (.059)
0.368 (.0145)
0.342 (.0135)
FEED D IRECTION
1.85 (.07 3)
1.65 (.06 5)
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.50 (.532)
12.80 (.504)
330.00 (14.173) MAX.
NOTES :
1. COM FO R M S TO E IA-418.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HU B.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457)
11.40 (.449)
1.75 (.069)
1.25 (.049)
16.10 (.634)
15.90 (.626)
15.42 (.609)
15.22 (.601)
27.40 (1.079)
23.90 (.941)
4
26.4 0 (1.039)
24.40 (.961 )
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.00 (2.362) MIN.
30.40 (1.197) MAX .
4
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http://www.irf.com/ Data and specifications subject to change without notice. 5/98
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