Datasheet IRF3315S, IRF3315L Datasheet (International Rectifier)

Page 1
PD - 9.1617A
PRELIMINARY
IRF3315S/L
HEXFET® Power MOSFET
l Advanced Process Technology l Surface Mount (IRF3315S) l Low-profile through-hole (IRF3315L) l 175°C Operating Temperature l Fast Switching l Fully Avalanche Rated
G
Description
Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications.
2
Pak is a surface mount power package capable of
The D accommodating die sizes up to HEX-4. It provides the highest power capability and the lowest possible on­resistance in any existing surface mount package. The D2Pak is suitable for high current applications because of its low internal connection resistance and can dissipate up to 2.0W in a typical surface mount application. The through-hole version (IRF3315L) is available for low­profile applications.
Absolute Maximum Ratings
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 21 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 15 A I
DM
PD @TA = 25°C Power Dissipation 3.8 W PD @TC = 25°C Power Dissipation 94 W
V
GS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt  2.5 V/ns T
J
T
STG
Pulsed Drain Current  84
Linear Derating Factor 0.63 W/°C Gate-to-Source Voltage ± 20 V Single Pulse Avalanche Energy 350 mJ Avalanche Current 12 A Repetitive Avalanche Energy 9.4 mJ
Operating Junction and -55 to + 175 Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case )
D
S
2
D Pak
V
R
DS(on)
TO-262
= 150V
DSS
= 0.082
ID = 21A
°C
Thermal Resistance
R
θJC
R
θJA
Junction-to-Case ––– 1.6 Junction-to-Ambient ( PCB Mounted,steady-state)** –– – 40
°C/W
11/7/97
Page 2
IRF3315S/L
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
V
(BR)DSS
R
DS(on)
V
GS(th)
g
fs
I
DSS
I
GSS
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
L
S
C
iss
C
oss
C
rss
Drain-to-Source Breakdown Voltage 150 ––– ––– V VGS = 0V, ID = 250µA
/T
Breakdown Voltage Temp. Coefficient ––– 0.187 ––– V/°C Reference to 25°C, ID = 1mA
J
Static Drain-to-Source On-Resistance ––– ––– 0.082 VGS = 10V, ID = 12A Gate Threshold Voltage 2. 0 ––– 4.0 V VDS = VGS, ID = 250µA Forward Transconductance 17 ––– ––– S VDS = 50V, ID = 12A
Drain-to-Source Leakage Current
––– ––– 25
––– ––– 250 VDS = 120V, VGS = 0V, TJ = 125°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100
VDS = 150V, VGS = 0V
µA
nA
VGS = -20V Total Gate Charge ––– ––– 95 ID = 12A Gate-to-Source Charge ––– ––– 11 nC VDS = 120V Gate-to-Drain ("Miller") Charge ––– ––– 47 VGS = 10V, See Fig. 6 and 13  Turn-On Delay Time ––– 9.6 ––– VDD = 75V Rise Time ––– 32 ––– ID = 12A Turn-Off Delay Time ––– 49 ––– RG = 5.1
ns
Fall Time ––– 38 ––– RD = 5.9Ω, See Fig. 10  Internal Source Inductance
––– –––
7.5
Between lead,
nH
and center of die contact Input Capacitance ––– 1300 ––– VGS = 0V Output Capacitance ––– 300 ––– pF VDS = 25V Reverse Transfer Capacitance ––– 160 ––– ƒ = 1.0MHz, See Fig. 5
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
I
S
I
SM
V
SD
t
rr
Q
rr
t
on
Notes:
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
V
DD
RG = 25, I
I
SD
TJ ≤ 175°C
** When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to application note #AN-994.
Continuous Source Current MOSFET symbol (Body Diode) Pulsed Source Current integral reverse (Body Diode)
––– –––
––– –––
21
84
showing the
A
p-n junction diode. Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 43A, VGS = 0V Reverse Recovery Time ––– 174 260 n s TJ = 25°C, IF = 43A Reverse Recovery Charge ––– 1.2 1.7 µC di/dt = 100A/µs Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Pulse width 300µs; duty cycle 2%.
= 25V, starting TJ = 25°C, L = 4.9 mH
= 12A. (See Figure 12)
AS
12A, di/dt 140A/µs, V
DD
V
(BR)DSS
Uses IRF3315 data and test conditions
,

D
G
S
Page 3
IRF3315S/L
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
4.5V
20µs PULSE WIDTH T = 25 C
J
V , Drain-to-Source Voltage (V)
DS
°
Fig 1. Typical Output Characteristics
100
°
T = 25 C
J
°
T = 175 C
J
100
10
D
I , Drain-to-Source Current (A)
1
0.1 1 10 100
VGS
TOP
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM
4.5V
20µs PULSE WIDTH T = 175 C
J
V , Drain-to-Source Voltage (V)
DS
4.5V
°
Fig 2. Typical Output Characteristics
3.0
2.5
I =
D
21A
10
D
I , Drain-to-Source Current (A)
V = 50V
DS
1
4 5 6 7 8 9 10
V , Gate-to-Source Voltage (V)
GS
20µs PULSE WIDTH
Fig 3. Typical Transfer Characteristics
2.0
1.5
(Normalized)
1.0
0.5
DS(on)
R , Drain-to-Source On Resistance
0.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
T , Junction Temperature( C)
J
Fig 4. Normalized On-Resistance
Vs. Temperature
V =
GS
°
10V
Page 4
IRF3315S/L
3000
2500
2000
1500
1000
C, Capacitance (pF)
500
0
1 10 100
V
=
0V,
GS
C
=
iss gs gd , ds
C
=
rss gd
C
=
oss ds gd
C
iss
C
oss
C
rss
V , Drain-to-Source Voltage (V)
DS
f = 1MHz
C
+ C C C
C SHORTED
+ C
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
100
20
I =
12
A
D
16
12
8
4
GS
V , Gate-to-Source Voltage (V)
0
0 20 40 60 80 100
V = 120V
DS
V = 75V
DS
V = 30V
DS
FOR TEST CIRCUIT
SEE FIGURE
Q , Total Gate Charge (nC)
G
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
13
°
T = 25 C
10
°
T = 175 C
J
1
SD
I , Reverse Drain Current (A)
0.1
0.2 0.5 0.8 1.1 1.4
V ,Source-to-Drain Voltage (V)
SD
J
V = 0 V
GS
Fig 7. Typical Source-Drain Diode
Forward Voltage
100
10us
100us
10
D
I , Drain Current (A)I , Drain Current (A)
°
= 25 C
C
T T= 175 C Single Pulse
1
1 10 100 1000
°
J
V , Drain-to-Source Voltage (V)
DS
1ms
10ms
Fig 8. Maximum Safe Operating Area
Page 5
IRF3315S/L
R
D.U.T.
D
+
V
DD
-
25
20
V
DS
V
GS
R
G
15
10
D
I , Drain Current (A)
5
Fig 10a. Switching Time Test Circuit
V
DS
10V
Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 %
90%
0
25 50 75 100 125 150 175
T , Case Temperature ( C)
C
°
10% V
GS
Fig 9. Maximum Drain Current Vs.
t
d(on)tr
t
d(off)tf
Case Temperature
Fig 10b. Switching Time Waveforms
10
thJC
1
D = 0.50
0.20
0.10
0.05
0.1
0.02
Thermal Response (Z )
0.01
0.01
0.00001 0.0001 0.001 0.01 0.1 1
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t / t
2. Peak T =P x Z + T
t , Rectangular Pulse Duration (sec)
1
J DM thJC C
1 2
P
DM
t
1
t
2
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Page 6
IRF3315S/L
A
15V
DRIVER
+
-
R
V
G
20V
DS
L
D.U.T
I
AS
0.01
t
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
I
AS
Fig 12b. Unclamped Inductive Waveforms
1000
TOP
800
600
V
DD
400
200
AS
E , Single Pulse Avalanche Energy (mJ)
0
25 50 75 100 125 150 175
Starting T , Junction Temperature( C)
J
BOTTOM
I
D
4.9A
8.5A 12A
°
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
Current Regulator
Same Type as D.U.T.
50K
Q
G
12V
10 V
Q
GS
V
G
Fig 13a. Basic Gate Charge Waveform
Q
GD
Charge
Fig 13b. Gate Charge Test Circuit
.2µF
V
GS
.3µF
D.U.T.
3mA
I
G
Current Sampling Resistors
I
+
V
DS
-
D
Page 7
IRF3315S/L
Peak Diode Recovery dv/dt Test Circuit
D.U.T
+
-
R
G
Driver Gate Drive
P.W.
+
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
• Low Leakage Inductance Current Transformer
-
-
dv/dt controlled by R
G
Driver same type as D.U.T.
ISD controlled by Duty Factor "D"
D.U.T. - Device Under Test
Period
D =
Period
P.W.
+
+
V
DD
-
VGS=10V
*
Reverse Recovery Current
Re-Applied Voltage
D.U.T. ISDWaveform
Body Diode Forward
D.U.T. VDSWaveform
Body Diode Forward Drop
Inductor Curent
Ripple 5%
* V
= 5V for Logic Level Devices
GS
Fig 14. For N-Channel HEXFETS
Current
di/dt
Diode Recovery
dv/dt
V
DD
I
SD
Page 8
IRF3315S/L
A
D2Pak Package Outline
10.54 (.415)
1.40 (.055) MAX.
1.78 (.070)
1.27 (.050)
1.40 (.055)
3X
1.14 (.045)
5.08 (.200)
NOTES: 1 D IMENS IO NS AFTER S OLDER D IP . 2 DIMENS IONING & TOLE RA N C ING PER A N S I Y14.5M, 1982. 3 CONTROLLING DIMENSION : INCH. 4 HEATSINK & LEAD DIMENSIONS DO NOT INCLUDE BURRS.
10.29 (.405)
- A ­2
1 3
15.49 (.610)
14.73 (.580)
0.93 (.037)
3X
0.69 (.027)
0.25 (.010) M B A M
4.69 (.185)
4.20 (.165)
5.28 (.208)
4.78 (.188)
0.55 (.022)
0.46 (.018)
LEAD ASSIGNMENTS 1 - G ATE 2 - D RA IN 3 - S OU RCE
- B -
1.32 (.052)
1.22 (.048)
2.79 (.110)
2.29 (.090)
1.39 (.055)
1.14 (.045)
10.16 (.400) REF.
6.47 (.255)
6.18 (.243)
2.61 (.103)
2.32 (.091)
8.89 (.350) REF.
MINIMUM RECOMMENDED FOOTPRINT
11.43 (.450)
8.89 (.350)
17.78 (.700)
3.81 (.150)
2.08 (.082) 2X
2.54 (.100) 2X
Part Marking Information
D2Pak
INTERNATIONAL R EC T IF IER L O GO
A S SE MB LY L O T COD E
F530S
9246
9 B 1 M
PART NUMB ER
DATE CODE (YYWW) YY = YEAR WW = WEEK
Page 9
Package Outline
TO-262 Outline
IRF3315S/L
Part Marking Information
TO-262
Page 10
IRF3315S/L
Tape & Reel Information
D2Pak
TRR
1.60 (.063)
1.50 (.059)
4.10 (.16 1)
3.90 (.15 3)
1.60 (.06 3)
1.50 (.05 9)
0.368 (.0145)
0.342 (.0135)
FEED DIRECTION
1.85 (.073)
1.65 (.065)
TRL
10.90 (.429)
10.70 (.421)
FEED DIRECTION
13.50 (.532)
12.80 (.504)
330.00 (14.173) MAX.
NOTES :
1. CO M F O R M S TO E IA - 4 18.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION MEASURED @ HUB.
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.
11.60 (.457)
11.40 (.449)
1.75 (.069 )
1.25 (.049 )
16.10 (.634)
15.90 (.626)
15.42 (.609 )
15.22 (.601 )
27 .4 0 ( 1.07 9 )
23.90 (.941) 4
26.40 (1.039)
24.40 (.961)
3
24.30 (.957)
23.90 (.941)
4.72 (.136)
4.52 (.178)
60.00 (2.362) M IN .
30.40 (1.197) MAX .
4
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
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http://www.irf.com/ Data and specifications subject to change without notice. 11/97
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