Datasheet 74F1056SCX Datasheet (Fairchild Semiconductor)

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© 1999 Fairchild Semiconductor Corporation DS011655 www.fairchildsemi.com
December 1993 Revised August 1999
74F1056 8-Bit Schottky Barrier Diode Array
74F1056 8-Bit Schottky Barrier Diode Array
General Description
The 74F1056 is an 8-bit Schottky barrier diode array designed to be employed as termination on the inputs to memory bus lines or CLOCK lines. This device is designed to suppress negative transien ts caused by line re flections, switching noise and crosstalk.
Features
8-Bit array structure designed to suppress negative transients
Guarante ed ESD protection (HBM) in excess of 4 kV
Common anode shared by all eight diodes
Broadside pinout for ease of bus routing
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering cod e.
Connection Diagram Schematic Diagram
Order Number Package Number Package Description
74F1056SC M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
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74F1056
Absolute Maximum Ratings(Note 1)
Note 1: Absolute maximum rating s are valued beyond which the device
may be damaged or have its useful life impaired. Functional operation under these conditi ons is not implied.
Note 2: These values apply for the t
w
100 µs, duty cycle 20%.
DC Electrical Characteristics
Over recommended operating free air temperature range, unless otherwise noted
SINGLE DIODE OPERATION (Note 3)
Note 3: These tests apply to separate diode operation, diodes not under test are open-circuit.
MULTIPLE DIODE OPERATION
Note 4: ICR is measured under the fo llowing conditions: One diode static, all ot hers switching
Switching diodes : t
W
= 100 µs; Static diode: VIN = 6V
Duty cycle = 20%, I
f
= 200 mA
The static diode input current is the internal crosstalk current I
CR
.
AC Electrical Characteristics
TA = 25°C
Storage Temperature 65°C to +150°C Operating Free-Air Temperature 0°C to 70°C Steady State Reverse Voltage, (V
R
)7.0V
Continuous Total Power Dissipation at or below
25°C Free-Air Temperature, (P
D
) 750 mW
Continuous Forward Current, (I
f
) Any Output Pin to GND 50 mA Total Through All GND Pins 170 mA
Repetitive Peak Forward Current, lfp (Note 2)
Any Output Pin to GND 300 mA Total Through All GND Pins 1.2A
ESD (HBM) 4 kV
Symbol Parameter Min Typ Max Units Conditions
V
BR
Reverse Breakdown Voltage 7.0 V IR = 10 µA
I
R
Static Reverse Current 10 µAVR = 7V
V
F
Static Forward Voltage −0.65 −0.85 V IF = 16 mA
0.8 1.0 IF = 50 mA
C
T
Total Capacitance 5 10 pF VI = 0V, f = 1 MHz
48 V
I
= 2V, f = 1 MHz
Symbol Parameter Min Typ Max Units Conditions
I
CR
Internal Crosstalk Current 0.2 2 mA Total GND current = 1.2A (Note 4)
Symbol Parameter Min Typ Max Units Conditions
Figure
Number
V
FR
Forward Recovery Voltage 1.25 V IF = 300 mA Figure 1
T
RR
Reverse Recovery Time 5.0 ns IF = 10 mA, IR = 1 mA Figure 2
RL = 100
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74F1056
AC Loading and Waveforms
tr = 20 ns, ZO = 50, freq = 500 Hz
FIGURE 1. Forward Recovery Voltage
tf = 0.5 ns, ZO = 50, tW = 50 ns, duty cycle = 0.01 R
L
= 100 (Note )
Monitored by Oscillos c ope having the following characteristics: t
r
350 ps, RI = 50, CI = 5 pF.
FIGURE 2. Reverse Recovery Time
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74F1056 8-Bit Schottky Barrier Diode Array
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M16A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit pate nt licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or syste ms which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea­sonably expected to result in a significant inju ry to the user.
2. A critical component i n any compon ent of a lif e support device or system whose failu re to perform can be rea­sonably expected to ca use the fa i lure of the life su pp ort device or system, or to affect its safety or effectiveness.
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