The CY7C1021B/10211B is a high-performance CMOS static
RAM organized as 65,536 words by 16 bits. This device has
an automatic power-down feature that significantly reduces
power consumption when deselected.
Writing to the device is accomplished by taking Chip Enable
) and Write Enable (WE) inputs LOW. If Byte Low Enable
(CE
(BLE) is LOW, then data from I/O pins (I/O1 through I/O8), is
written into the location specified on the address pins (A
through A15). If Byte High Enable (BHE) is LOW, then data
from I/O pins (I/O
specified on the address pins (A
through I/O16) is written into the location
9
through A15).
0
Reading from the device is accomplished by taking Chip Enable (CE
Enable (WE
) and Output Enable (OE) LOW while f orcing the Write
) HIGH. If Byte Low Enable (BLE) is LOW, then
data from the memory location specified by the address pins
will appear on I/O
then data from memory will appear on I/O
truth table at the back of this data sheet for a com plete descrip-
to I/O8. If Byte High Enable (BHE) is LOW,
1
to I/O16. See the
9
tion of read and write modes.
The input/output pins (I/O
high-impedance state when the device is deselected (CE
through I/O16) are placed in a
1
HIGH), the outputs are disabled (OE HIGH), the BHE and BLE
are disabled (BHE, BLE HIGH), or during a write operation (CE
LOW, and WE LOW).
The CY7C1021B/10211B is available in standard 44-pin
TSOP Type II and 400-mil-wide SOJ packages. Customers
should use part number CY7C10211B when ordering parts
with 10ns t
, and CY7C1021B when ordering 12 and 15n s taa.
aa
0
Logic Block Diagram
DATA IN DRIVERS
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
ROW DECODER
64K x 16
RAM Array
512 X 2048
COLUMN DECODER
8
A
A
9
A10A11A
I/O
–I/O
1
8
SENSE AMPS
I/O9–I/O
16
BHE
WE
12
14
15
A13A
A
CE
OE
BLE
1021B-1
Pin Configuration
SOJ / TSOP II
Top View
44
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
WE
A
A
A
A
NC
A
A
A
A
A
CE
CC
SS
15
14
13
12
1
4
2
3
3
2
4
1
5
0
6
7
1
8
2
9
3
10
4
11
12
13
5
14
6
15
7
16
8
17
18
19
20
21
22
A
5
43
A
6
42
A
7
41
OE
40
BHE
39
BLE
38
I/O
37
I/O
36
I/O
35
I/O
34
V
SS
33
V
CC
32
I/O
31
I/O
30
I/O
29
I/O
28
NC
27
A
8
26
A
9
25
A
10
A
24
11
23
NC
1021B-2
16
15
14
13
12
11
10
9
Selection Guide
7C10211B-107C1021B-127C1021B-15
Maximum Access Time (ns)Commercial101215
Maximum Operating Current (mA)Commercial150140130
Maximum CMOS Standby Current (mA)Commercial101010
L0.50.50.5
Cypress Semiconductor Corporation•3901 North First Street•San Jose•CA 95134•408-943-2600
Document #: 38-05145 Rev. ** Revised September 6, 2001
CY7C1021B/
Maximum Ratings
(Above which the useful life may be impai red. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage on V
DC Voltage Applied to Outputs
in High Z State
[1]
DC Input Voltage
to Relative GND
CC
......................................–0.5V to VCC+0.5V
[1]
..................................–0.5V to VCC+0.5V
[1]
....–0.5V to +7.0V
Electrical Characteristics Ov er the Op erat ing Range
ParameterDescription
V
OH
V
OL
V
IH
V
IL
I
IX
I
OZ
Output HIGH
Voltage
Output LOW
Voltage
Input HIGH
Voltage
Input LOW
[1]
Voltage
Input Load
Current
Output
Leakage
Current
I
I
OS
CC
Output Short
Circuit
[3]
Current
VCC
Operating
Supply
Current
I
SB1
Automatic CE
Power-Down
Current
—TTL Inputs
I
SB2
Automatic CE
Power-Down
Current
—CMOS
Inputs
VCC = Min.,
IOH = –4.0 mA
VCC = Min.,
IOL = 8.0 mA
GND < VI < V
GND < VI < VCC,
Output Disabled
VCC = Max.,
V
VCC = Max.,
I
OUT
f = f
Max. VCC,
CE
VIN > VIH or
VIN < VIL,
f = f
Max. VCC,
CE
V
VCC – 0.3V,
or V
0
Test
Conditions
= GND
OUT
= 0 mA,
= 1/t
MAX
> V
IH
MAX
>
– 0.3V , VIN >
CC
< 0.3V , f =
IN
CC
RC
L0.50.50.5mA
CY7C10211B
Current into Outputs (LOW)........................................ 20 mA
Latch-Up Current.....................................................>200 mA
Operating Range
Range
Temperature
Commercial0°C to +70°C 5V ± 10%
Industrial–40°C to +85°C5V ± 10%
Ambient
7C10211B-10
7C1021B-127C1021B-15
2.42.42.4V
0.40.40.4V
2.26.02.26.02.26.0V
−0.50.8–0.50.8–0.50.8V
−1+1–1+1–1+1µA
−1+1–1+1–1+1µA
−300
–300–300mA
150140130mA
404040mA
101010mA
[2]
V
CC
UnitMin.Max.Min.Max.Min.Max.
Document #: 38-05145 Rev. **Page 2 of 11
CY7C1021B/
CY7C10211B
Capacitance
[4]
ParameterDescriptionTest ConditionsMax.Unit
C
IN
C
OUT
Input CapacitanceTA = 25°C, f = 1 MHz,
= 5.0V
V
Output Capacitance8pF
CC
8pF
AC Test Loads and Waveforms
5 pF
(b)
R 481Ω
1021B-3
1.73V
R2
255
3.0V
GND
Ω
Rise Time: 1 V/nsFall Time:1 V/ns
ALL INPUT PULSES
90%
10%
5V
OUTPUT
INCLUDING
JIG AND
SCOPE
Equivalent to:
30 pF
R 481Ω
(a)
THÉVENIN
EQUIVALENT
OUTPUT
R2
255
Ω
OUTPUT
5V
INCLUDING
JIG AND
SCOPE
167
30 pF
90%
10%
1021B-4
Document #: 38-05145 Rev. **Page 3 of 11
CY7C1021B/
CY7C10211B
Switching Characteristics
[5]
Over the Operating Range
7C10211B-107C1021B-127C1021B-15
ParameterDescription
READ CYCLE
t
RC
t
AA
t
OHA
t
ACE
t
DOE
t
LZOE
t
HZOE
t
LZCE
t
HZCE
t
PU
t
PD
t
DBE
t
LZBE
t
HZBE
WRITE CYCLE
t
WC
t
SCE
t
AW
t
HA
t
SA
t
PWE
t
SD
t
HD
t
LZWE
t
HZWE
t
BW
Notes:
(min.) = –2.0V for pulse durati ons of l ess than 2 0 ns.
1. V
IL
is the “Instant On” case temperatur e.
2. T
A
3. Not more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
4. Tested initially and after any design or process changes that may affect these parameters.
5. T est conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V , input pulse levels of 0 to 3.0V, and output loading of the specified
6. At any given temperature and voltage condition, t
7. t
8. The internal write time of the memory is defined by the overlap of CE
and 30-pF load c apacitan ce.
I
OL/IOH
, t
HZOE
and the transition of these sig nals can t erminate the writ e. The input data set-up and hold timing s hould be refere nced to the leading edge of the signal t hat terminates the write.
Read Cycle Time101215ns
Address to Data Valid101215ns
Data Hold from Address Change333ns
CE LOW to Data Valid101215ns
OE LOW to Data Valid567ns
OE LOW to Low Z
OE HIGH to High Z
CE LOW to Low Z
CE HIGH to High Z
[6]
[6, 7]
[6]
[6, 7]
000ns
567ns
333ns
567ns
CE LOW to Power-Up000ns
CE HIGH to Power-Down101215ns
Byte Enable to Data Valid567ns
Byte Enable to Low Z000ns
Byte Disable to High Z567ns
[8]
Write Cycle Time101215ns
CE LOW to Write End8910ns
Address Set-Up to Write End7810ns
Address Hold from Write End000ns
Address Set-Up to Write Start000ns
WE Pulse Width7810ns
Data Set-Up to Write End568ns
Data Hold from Write End000ns
WE HIGH to Low Z
WE LOW to High Z
[6]
[6, 7]
333ns
567ns
Byte Enable to End of Write789ns
HZBE
, t
HZCE
, and t
is less than t
are specified w ith a load ca pacit ance of 5 pF as in part (b ) of AC Test L oads. T ransiti on i s measured ±500 mV from steady-state voltage.
HZWE
HZCE
, t
LZCE
is less than t
HZOE
LOW, WE LOW and BHE / BLE LOW. CE, WE and BHE / BLE must be LOW to initiate a write,
LZOE
, and t
HZWE
is less than t
for any given device.
LZWE
UnitMin.Max.Min.Max.Min.Max.
Document #: 38-05145 Rev. **Page 4 of 11
CY7C1021B/
Switching Waveforms
Read Cycle No. 1
ADDRESS
DATA OUT
Read Cycle No. 2
ADDRESS
CE
OE
BHE, BLE
DATA OUT
V
CC
SUPPLY
CURRENT
[9, 10]
PREVIOUS DATA VALIDDATA VALID
Controlled)
(OE
HIGH IMPEDANCE
t
LZCE
t
PU
[10, 11]
t
ACE
t
DOE
t
LZOE
t
DBE
t
LZBE
t
OHA
50%
t
RC
t
AA
t
RC
t
HZOE
DATA VALID
CY7C10211B
t
HZCE
t
HZBE
t
PD
HIGH
IMPEDANCE
1021B-5
I
ICC
CC
50%
I
ISB
SB
1021B-6
Notes:
9. Device is continuously selected. OE
10. WE
is HIGH for read cycle .
11. Address valid prior to or coincident with CE
, CE, BHE and/or BHE = VIL.
transition LOW .
Document #: 38-05145 Rev. **Page 5 of 11
CY7C1021B/
Switching Waveforms (continued)
t
SA
[12, 13]
Write Cycle No. 1 (CE
ADDRESS
CE
WE
BHE, BLE
Controlled)
t
AW
t
WC
t
SCE
t
PWE
t
BW
CY7C10211B
t
HA
DATA I/O
Write Cycle No. 2 (BLEorBHE Controlled)
ADDRESS
t
BHE
,BLE
WE
CE
SA
t
AW
t
WC
t
BW
t
PWE
t
SCE
t
SD
t
HD
1021B-7
t
HA
t
SD
t
HD
DATA I/O
1021B-8
Notes:
12. Data I/O is high impedance if OE
13. If CE
goes HIGH simultaneousl y with WE going HIGH, the o utput remains in a hig h-imped ance stat e.
HLHigh ZData InWrite - Upper bits onlyActive (ICC)
LHHXXHigh ZHigh ZSelected, Outputs Disable d Active (ICC)
LXXHHHigh ZHigh ZSelected, Outputs Di sa ble dActive (ICC)
CY7C1021B-15VIV3444-Lead (400-Mil) Molded SOJIndustrial
CY7C1021BL-15VCV3444-Lead (400-Mil) Molded SOJCommercial
CY7C1021B-15ZCZ4444-Lead TSOP Type II
CY7C1021B-15ZIZ4444-Lead TSOP Type IIIndustrial
CY7C1021BL-15ZCZ4444-Lead TSOP Type II
Package
NamePackage Type
Commercial
Commercial
CY7C10211B
Operating
Range
Document #: 38-05145 Rev. **Page 8 of 11
CY7C1021B/
Package Diagrams
44-Lead (400-Mil) Mo lded SOJ V3 4
CY7C10211B
51-85082-B
Document #: 38-05145 Rev. **Page 9 of 11
CY7C1021B/
ng so indemnifies Cypress Semiconductor against all charges.